STIL, Part of Marposs S.p.A. products
STIL - Non-contact Defects Inspection System
Vision systems have a dual role: to provide a good quality image of the sample surface at the desired magnification and to process the image in order to detect and analyze certain predefined features or textures. Although processing units are becoming more and more powerful, the main limitation of current vision systems is their very small depth of field (a few tens of µm or less, depending on the magnification and numerical aperture).
STIL - Model MC2 Series - Non-Contact Measurement With Chromaline Camera
Vision systems have a dual role: Provide a good quality image of the sample surface at the desired magnification. Process the image to detect and analyze certain predefined features or textures. Although processing units are becoming more and more powerful, the main limitation of current vision systems is their very shallow depth of field (a few tens of µm or less, depending on the numerical aperture). Because of this limitation, expensive and complicated Z-scanning systems and/or auto-focusing mechanisms are required to view samples with larger Z-extension and moving samples. Chromaline camera incorporating chromatic confocal microscopy technology is a technology that enables the design of optical systems with a very large depth of field (up to several mm). With Chromaline camera, frequency acquisition is available up to 199,500 lines/second.
STIL ZENITH - Non-Contact Measurement With Chromapoint Controller
ZENITH controller is the new reference for chromatic confocal controllers adapted to the industrial environment. Based on the Ethernet standard communication, ZENITH allows high precision measurements without contact and without risk of altering the parts. Its robustness, its ease of use and implementation are designed to operate 24/7 (24 hours a day, 7 days a week, 52 weeks a year). Among the various advantages of ZENITH is the measurement of distance and thickness at very high resolution on all types of surfaces and materials, including reflective surfaces. ZENITH controller is compatible with all STIL sensor heads: CL-MG, OP, ENDO, EVEREST. Flexible, ZENITH controller has a performance adapted to each measurement range.
Measurement and Inspection Device of Membranes
When manufacturing key components of Fuel Cells and Electrolyzers, it is critically important that the main dimensional characteristics are accurate, as well as assuring there are no defects present that could compromise their correct functioning or efficiency. The production process of components such as membranes, CCM (Catalyst Coated Membrane), MEA (Membrane Electrode Assembly), GDL (Gas Diffusion Layer), flow plates and BPP (Bi-Polar Plates) can generate scratches, tears, ripples, inclusions, contaminants, etc., which, depending on their size, could be particularly harmful. For the analysis during the product development phase, as well as for sampling in the production line, Marposs offers a semi-automatic station dedicated to quality control on large flat components. This system is designed to carry out precise dimensional checks and provide a complete inspection aimed at detecting different types of defects.
STIL - Model MPLS-DM Series - Non-Contact Measurement With Chromaline Sensor
With 180 measuring points aligned along a line ranging from 1 to 12 millimeters, the new MPLS-DM version enables high-quality inspection with new capabilities, and working frequencies up to 2kHz in standard mode, and even 6kHz with a reduced sensor measuring range.
