WITec GmbH products

alpha300 RA – Combination of Chemical and Nanoscale Structural Imaging in one System. The well-established Raman-AFM combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument configurations for correlative Raman-AFM microscopy. The alpha300 RA incorporates the features of the Raman microscopy system alpha300 R for powerful chemical imaging along with Atomic Force Microscopy (alpha300 A) for high-resolution nanoscale surface characterization. Thus correlative Raman AFM imaging  facilitates a comprehensive understanding of the samples.

For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit. It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for high-resolution Raman imaging techniques such as nearfield-Raman imaging.

World`s first fully-integrated Raman Imaging and Scanning Electron Microscopes. RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.

Chemical Analysis and Profilometry in One Pass. WITec’s patented TrueSurface Microscopy option enables confocal Raman imaging guided by surface topography. Topographic Raman Imaging, a technique pioneered by WITec, uses an advanced optical profilometer integrated within the instrument to provide one-pass simultaneous operation.