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Microscopes FT-IR Brochure
JASCO INTERNATIONAL CO., LTD.4-21, Sennin-cho 2-chome, Hachioji, Tokyo 193-0835, Japan Tel: +81-42-666-1322 Fax: +81-42-665-6512 http://www.jascoint.co.jp/english/Australia, China, Hong Kong, India, Indonesia, Iran, Korea, Malaysia, New Zealand, Pakistan, Philippines, Russia, Singapore, South Africa, Taiwan, ThailandJASCO EUROPE s.r.l. Via Luigi Cadorna 1, 23894 Cremella (Lc), Italy Tel: +39-039-9215811 Fax: +39-039-9215835 http://www.jasco-europe.com JASCO Deutschland www.jasco.de, JASCO UK www.jasco.co.uk, JASCO France www.jascofrance.fr, JASCO Benelux www.jasco.nl, JASCO Spain www.jasco-spain.com, JASCO Scandinavia www.jascoscandinavia.seItaly, Germany, U.K., France, Netherlands, Belgium, Luxembourg, Spain, Sweden, Norway, Denmark, Austria, Finland, Greece, Hungary, Poland, Portugal, Romania, Switzerland, Algeria, Cyprus, Egypt, Israel, Jordan, Kuwait, Lebanon, Morocco, Saudi Arabia, Syria, Tunisia, Turkey, U.A.E., YemenJASCO INCORPORATED28600 Mary's Court, Easton, MD 21601, U.S.A Tel:+1-800-333-5272 +1-410-822-1220 Fax:+1-410-822-7526 http://www.jascoinc.comU.S.A., Canada, Costa Rica, Mexico, Puerto Rico, Argentina, Brazil, Chile, Colombia, Paraguay, Peru, Uruguay, GuatemalaSpecifications are subject to change without notice.For more information, please contact:BIR01-1010 Printed in Japan.JASCO’s Advanced Research-Grade FT-IR MicroscopesInnovation in FT-IR microscopy and imaging systemsIRT-5000IRT-7000SInfrared MicroscopeFully automated Infrared MicroscopeIRT-7000Multi-channel Infrared MicroscopeIRT-5000/7000S/7000 SpecificationsPrinciple FT-IR microscope with cassegrain optical systemIRT-5000 IRT-7000S IRT-7000Transmittance / Reflectance measurementSingle mid-band MCT (7800 - 650 cm-1)Single mid-band MCT (7800 - 650 cm-1)Linear array MCT (7000 - 750 cm-1) (1 × 16 element)Single mid-band MCT (7800 - 650 cm-1)Dual detector capability (software controlled), user exchangeable single element detectors are available as an option.Narrow-band MCT (7800 - 750 cm-1)Wide-band MCT (7800 - 450 cm-1)DLATGS (7800 - 400 cm-1)InSb (15000 - 1850 cm-1)InGaAs (12000 - 4000 cm-1)MCT (7000 - 750 cm-1) (1 × 16 element)MCT (7000 - 750 cm-1) (2 × 16 element)InSb (10000 - 1900 cm-1) (1 × 16 element)InGaAs (10000 - 5000 cm-1) (1 × 16 element)Narrow-band MCT (7800 - 750 cm-1)Wide-band MCT (7800 - 450 cm-1)DLATGS (7800 - 400 cm-1)InSb (15000 - 1850 cm-1)InGaAs (12000 - 4000 cm-1)MCT (7000 - 750 cm-1) (2 × 16 element)InSb (10000 - 1900 cm-1) (1 × 16 element)InGaAs (10000 - 5000 cm-1) (1 × 16 element)Measurement methodStandard detectorDetector exchangeOptional detectorsSingle element detectorLinear array detectorS/N ratioSingle element detector5000:1 (Aperture size 100 µm2, resolution 4 cm-1, 1 min. acquisition, near 2200 cm-1, p-p)5000:1 (Aperture size 100 µm2, resolution 4 cm-1, 1 min. acquisition, near 2200 cm-1, p-p)Linear array detector1000:1 (Aperture size 12.5 µm2, resolution 16 cm-1, 1 min. acquisition, near 2200 cm-1, p-p)-Sample observationHigh resolution CMOS camera 1.3 million pixels with a 3× optical zoom function (standard)IQ Monitor (simultaneous sample measurement and observation) and auto illumination function (standard)5.7 inch integrated color LCD display (option), Binocular (option)Observation options Visible polarization observation, Differential interference contrast observation, Fluorescence observation, Refractive objectives (10×, 20×)Auto focus Option StandardMicroscope objectivesCassegrain: 16×, 32× or 10×Automatic objective recognition function (standard)Up to four objectives can be selected by the software.Cassegrain: 16× and 32× as standard, 10× as optionAutomatic objective recognition function (standard)Up to four objectives can be selected by the software.Condenser mirrorCassegrain: 16×, 32× or 10× (manual exchange)Automatic condenser mirror recognition function (standard)Cassegrain: 16×, 32× as standard (manual exchange),10× as optionCondenser mirror compensation Standard auto-compensation functionAperture PC-controlled vertical/horizontal adjustment and angle of rotationSample stageStandardOption Joystick for auto XYZ stage controlManual stage with fine adjustment(Movable distance: X: 70, Y: 50, Z: 20 mm)Auto XYZ stage with auto-focus function(Movable distance X: 100, Y: 75, Z: 25 mm, 1 µm step)Joystick for auto XYZ stage controlAuto XYZ stage with auto-focus function (Movable distance X: 100, Y: 75, Z: 25 mm, 1 µm step)Purge Sample area purge case is available as an option.Integrated control panelTransmittance/Reflectance switching with indicator; detector indicator; objective selection/indicator; open/close and rotation of aperture; auto-compensation of condenser mirror; visible illumination adjustmentATR measurement (option) "Clear-View" ATR objective (ATR-5000-SS/SD/SG)*1, conventional ATR objective (ATR-5000-D/Z/G)*1,Stage-mounted micro ATR using transmittance light path (ATR-5000-TPZ)Grazing angle measurement(option) Cassegrain grazing angle objective (RAS-5000)*2Dimension (H × W × D) 587 mm × 302 mm × 695 mm 612 mm × 302 mm × 695 mmWeight 54 kg 56 kgPower consumption AC 100 - 240 V, 50/60 Hz, max. 70 VA AC 100 - 240 V, 50/60 Hz, max. 105 VA*1 Pressure sensor (PRS-M-5000, PRS-A-5000) is required.*2 Infrared polarizer (PL-IR-5000, PL-IR-7000) is required.2 3Unparalleled performance, flexibility and ease of use Unparalleled performance, flexibility and ease of use Advanced FT-IR Microscopes for the FT/IR-4000/6000 Series spectrometersAdvanced FT-IR Microscopes for the FT/IR-4000/6000 Series spectrometersATR Mapping of 2 µm silica bead using the IQ Mapping functionATR Imaging by using ATR objective Colored 3D display of Si-O peak area near 1100 cm-1FT-IR Micro-area Analysis IQ MappingTMJASCO’s new FT-IR microscope systems feature an innovative capability for sample analysis called “IQ Mapping”. This function enables automated multi-point mapping, line mapping, grid mapping and IR Imaging analyses of a microscopic area with a manual sample stage and a single element detector. The microscope system automatically scans the specified points or area, rapidly collecting a full spectrum of each point without moving the sample stage.The IQ Mapping coupled with ATR objective allows ATR mapping and ATR Imaging of any sample in contact with the ATR objective without moving the sample stage or ATR objective. This function provides high-speed and cross-contaminant free measurements of a small sampling area. Conventional ATR objectives can only provide sample measurements at the immediate center of the crystal, requiring movement of the ATR objective and sample stage for data collection of multiple sampling sites. In addition, JASCO’s unique “Clear-View” ATR objective enables a simultaneous sample view even during ATR data collection after the ATR crystal element contacts the sample. JASCO’s innovative FT-IR Microscopes, the IRT-5000, 7000S and 7000 series provide new functions that dramatically improve infrared micro-spectroscopy analyses. These microscopes can be easily interfaced with either the FT/IR-4000 or FT/IR-6000 series spectrometers, offering the most advanced microscopy and imaging systems available in the market today. Coupling JASCO’s proven technology for infrared spectroscopy (accumulated over 50 years) with the most advanced optical design, the IRT-5000, 7000S and 7000 offer the best solution for even the most challenging sample analyses.The IRT-5000 FT-IR microscope employs a mid-band MCT detector as standard, while up to two detectors can be simultaneously installed as an option. The standard “IQ Mapping” function allows multi-point, line, area and ATR mapping experiments without moving the sample stage, in addition to single-point measurements. An optional automatic X-Y-Z sample stage enables auto-focus and mapping analysis of larger sample areas.IQ MappingDual detector capabilityVariety of measurement modes(Transmission, reflection, ATR, Grazing Angle Reflectance)Multiple objective capabilitiesField upgrade to IR Imaging using a linear array detectorThe IRT-7000S FT-IR fully automated microscope employs a mid-band MCT detector as standard, while up to two detectors can be simultaneously installed as an option. It is easily field-upgradable to an IR imaging system by adding an optional linear array detector. The standard automatic sample stage provides wide area mapping and multi-ATR mapping by combining the “IQ Mapping” function with the XYZ auto-stage .Fully automated sample stage with auto focus function as standardIQ MappingUp to four objectivesDual detector capabilityField upgrade to IR imaging using a linear array detectorThe IRT-7000 FT-IR multi-channel microscope offers two detectors as standard, a 16-channel linear array detector and a single-point MCT detector. The combination of the standard automatic sample stage and “IQ Mapping” function allows mapping analyses of a larger sample area, multi-area ATR mapping, and IR imaging of a specific area with extremely high spatial resolution and excellent sensitivity in a short time.Full IR Imaging functionIQ MappingUp to four objectivesWide area mapping and multi-ATR imagingDynamic Imaging with FT-IR step-scan optionMultivariate analysis PCA(Principal Component Analysis) (standard)For FT-IR measurement, absorption peaks due to atmospheric water vapor and CO2 can make it difficult to obtain high quality sample spectra. The most effective solution to this problem is the measurement of samples in vacuum. As a factory option, JASCO supplies a vacuum type FT-IR microscope system to be used with the FT/IR-6000V (vacuum interferometer) or FT/IR-6000FV (full vacuum) spectrometers.High optical throughputExcellent signal to noise ratioHigh spatial resolutionOperational flexibilityExpandable capabilitiesFull range of accessoriesFT-IR Microscopy and Imaging SystemsIRT-5000VC/IRT-7000VCFT-IR Full Vacuum type MicroscopesIRT-5000 Infrared Microscope Manual sample stageMid-band MCT detectorIRT-7000S Fully Automated IR Microscope Automatic sample stageMid-band MCT detectorIRT-7000 Multi-channel IR Microscope Automatic sample stageMid-band MCT detector and linear array detectorExceptional visual observation qualityAll microscopes are equipped with a high-resolution CMOS video camera with a 3× optical zoom capability, which allows high quality sample observation. Digital zoom function is also available for sample visualization at much higher magnification. 4 5 Unique approach of having a single platform for any JASCO spectroscopy systemUnique approach of having a single platform for any JASCO spectroscopy systemSpectra Manager TM II Cross-platform spectroscopy software package Spectra Manager TM II Cross-platform spectroscopy software package Superior user-friendly graphical interface Auto-focus functionA full-featured software package, Spectra Manager II provides automatic functions and simplified operational procedures to minimize manual operations. Measurement conditions, microscope sample monitoring/control operations and measurement results can be reviewed in a single screen. The dedicated microscope interface provides various types of measurements such as single and multiple points, mapping, and linear array measurements using a single mouse-click for mode selection. The auto-focus function is standard for the IRT-7000S/7000. Contrast dynamics of the sample image are shown in a graph after initialization of the auto-focus function. The stage can be automatically moved to a target focal point by clicking a peak maximum in the contrast graph. Macro-stage control On the macro-stage map, designed as the image of the sample holder, the current stage position is indicated with a red point. By double-clicking a target point on the macro-stage map, the auto-stage quickly moves itself to the desired position for sample observation or measurement. By simply clicking on a spectral feature in the ‘Monitor’ display, a chemical image can be displayed as a color 3-D image, a 3-D figure, a contour plot, or a color-coded plot. The microscope image and the chemical image can be overlaid in a single screen by selecting the chemical image and configuring the image transparency. Auto-focus/Auto-illuminationRegistration of commonly used aperture settingsAutomatic recognition of microscope objectivesThumbnail display memorizing the sample position with focus and aperture informationSpectrum preview to check conditions before measurementIQ Monitoring for simultaneous observation of the spectrum and sample imageMacro-stage control to quickly move to the desired sample position Auto-adjustment of condenser cassegrain objective Data storage linked with sample image and aperture informationReport publishing capability (JASCO Canvas)A wide range of data acquisition modes provides the best solution for almost any type of sample and application.Based on the IR mapping data of a protein or other tissue sample, the secondary structure estimation (SSE) software analyzes the secondary structure of the sample based on the Amide I and II absorptions, providing chemical image maps based on the contributions of the secondary structures of the proteins in the sample. In the example, the IR mapping data of the cross-section of a rabbit blood vessel is used to construct the chemical image maps of the distributions of a-Helix and ß-Sheet proteins in the sample. The combination of the automatic sample stage and the “IQ Mapping” function allows mapping analyses of a large sample area, multi-area ATR mapping, and IR imaging of a specific area with extremely high spatial resolution and excellent sensitivity in a short time.Wide area (490 × 490 µm) ATR imaging by the combination of IQ Mapping with the automated XYZ stageThe PCA (Principal Components Analysis) mapping data analysis program creates chemical images based on the differences in spectral characteristics of the infrared spectra, analyzing those differences and grouping them as principal components.In the example below, the PCA mapping software analyzes the differences in the pigments for an LCD color display, groups them based on the chemical differences of the three RGB components and provides the color image maps of the components. Microscope image 3-D image Contour plot Overlay of microscope image and contour plot * Optional for IRT-5000/7000S/7000* Optional for IRT-5000, standard for IRT-7000S/7000Microscope imageMicroscope imageChemical image of ß-SheetStudy of arteriosclerosis in a rabbitPCA mapping analysis of LCD display panelMeasurement program window (IRT-5000 with a single element detector)Measurement program window (IRT-7000 with a linear array detector)Analysis program windowWide-area ATR MappingCombining an FT/IR-6000 with the step-scan option offers advanced capabilities for dynamic imaging as well as time-resolved measurements of a spec i f ic a rea a t the maximum t ime resolution of 5 µsec.IQ MappingSingle pointMulti-pointLine MappingGrid MappingMicro-ATR MappingIQ Mapping with automatic X-Y-Z stageWide-area MappingWide-area ATR MappingLinear array detector and rapid scanIR ImagingLinear array detector and step scanDynamic Imaging Dynamic ImagingA B CSpectra of LCD display panelChemical imaging features Sampling flexibilityDedicated analysis softwarePCA mapping data analysis programIR mapping secondary structure analysis programTimeABC0.94000 3500Wavelength [cm-1]3000 2500Abs11.52Contrast graphMacro-stage mapChemical image of a-Helix6 7Expandability to customize the systemExpandability to customize the systemOptional FT-IR Microscope accessories Optional FT-IR Microscope accessories An electronically-controlled, 4-position objective carousel can be fitted with any combination of 10×, 16×, 32×, or grazing-angle cassegrain objectives, 10× or 20× refractive objectives or micro-ATR objectives. These objectives are automatically recognized when attached.* Please use Au-coated cassegrains for measurements in the near-infrared region.Cassegrain objectives for reflection measurements onlySpecifications Normal sample viewing area Aperture setting area Measurement area using IQ mapping16× Cassegrain 600 µm × 480 µm X: 0 ~ 500 µm, Y: 0 ~ 500 µm X: -200 ~ 200 µm, Y: -200 ~ 200 µm (Max. 500 × 500 µm) (Max. 400 × 400 µm)32× Cassegrain 300 µm × 240 µm X: 0 ~ 250 µm, Y: 0 ~ 250 µm X: -100 ~ 100 µm, Y: -100 ~ 100 µm (Max. 250 × 250 µm) (Max. 200 × 200 µm)10× Cassegrain 960 µm × 768 µm X: 0 ~ 800 µm, Y: 0 ~ 800 µm X: -320 ~ 320 µm, Y: -320 ~ 320 µm (Max. 800 × 800 µm) (Max. 640 × 640 µm)Sample viewing function during a sample in contact with ATR crystal* The optional pressure sensor is required.The innovative “Clear-View” ATR objectives permit both ATR data collection and viewing of the sample by using the same cassegrain elements, simply changing the crystal position up and down. In addition, the ATR-5000-SD and ATR-5000-SS enables a simultaneous sample view even during ATR data collection after the ATR crystal element contacts the sample, a capability not available in conventional ATR objectives. This innovative function allows the selection of a specific area of the sample while observing the entire area of the sample that is in contact with the crystal element.ATR-5000-SD ATR-5000-SS ATR-5000-SGThe ATR-5000-SD/SS/SG enables sample viewing by setting the ATR crystal in the raised position. The ATR-5000-SD and SS enable sample viewing through the ATR crystal after contact with the sample surface.The ATR-5000-SD and SS provide simultaneous sample view during ATR data collection.ATR crystalSampleThe pressure sensor is required for the ATR Cassegrain objectives and is used to maintain constant pressure during an ATR measurement. The alarm functions when the sensor recognizes excessive pressure between the sample and the crystal. The pressure sensor display panel is standard and can be mounted on the control panel of the microscope.PRS-A-5000 PRS-M-5000Normal sample view with the crystal element in the raised positionSample viewing after crystal contact with the sample areaATR measurement and simultaneous sample viewingObjective lenses for sample observationATR-5000-SD “Clear-View” ATR Objective with diamond crystalATR-5000-SS “Clear-View” ATR Objective with ZnS crystalATR-5000-SG “Clear-View” ATR Objective with Ge crystalATR-5000-Z ATR Objective with ZnSe crystalATR-5000-G ATR Objective with Ge crystalATR-5000-D ATR Objective with diamond crystalATR-5000-G45 ATR Objective with Ge crystal, projection typeObjective/condenser cassegrain pair for transmission and reflection measurementsCassegrain objectives for transmission and reflection measurementsMultiple objective capabilitiesATR-5000-TPZ Transmittance type ATR (without crystal)PKT-ZNSE Crystal kit, ZnSe for ATR-5000-TPZPKT-ZNS Crystal kit, ZnS for ATR-5000-TPZ* The ATR-5000-TPZ requires the PKT-ZNSE or PKT-ZNS crystal kit.SampleLight path of ATR-5000-TPZ“Clear-View” ATR objectivesPressure sensorThe grazing-angle reflection method is utilized for measurement of a thin film on a metal surface (Å to several µm in thickness) using polarized light. This objective greatly improves the sensitivity over the standard reflection method.RAS-5000 Grazing Angle Reflection ObjectiveThe polarizer is integrated into the FT-IR microscope and all polarizer control such as angle setting and insertion in the light path is accomplished by the software. The polarizer is used to perform infrared polarization measurements of samples and highly sensitive polarized reflectance measurements.Grazing angle reflection objective Infrared polarizerThe ATR-5000-TPZ enables micro-ATR measurements of a sample using the transmittance light path of the microscope. The sample is fixed on the surface of the ATR crystal and the entire assembly is put on the sample stage. The combination of the automatic sample stage allows ATR mapping of a wide sample area with a maximum area of 2.5 × 1 mm. The ATR-5000-TPZ, which requires a single sample-ATR crystal contact for ATR mapping, eliminates cross-contamination concerns.The ATR-5000-Z (ZnSe crystal) is useful when the sample has a low refractive index and for cases when deep penetration into a sample is required. The ATR-5000-G (Ge crystal) is useful when the sample has a high refractive index and for cases where a shallow penetration depth is required. The ATR-5000-D (diamond crystal) features are used for extremely hard samples or for chemically reactive samples. The ATR-5000-G45 is designed for better contact with samples that have a rough topography.Transmittance ATR accessory Standard ATR objectivesATR-5000-TPZPRS-A-5000 Pressure sensor for auto-stagePRS-M-5000 Pressure sensor for manual stagePressure sensor display panelSample image after contact of the ATR crystal with the sample surfaceSample image before contact of the ATR crystal with the sample surfaceThe figures below illustrate the analysis of a multi-layer medical packaging film by using the IRT-7000 and the ATR-5000-SS (ZnS crystal) “Clear-View” ATR objective. The film was embedded in an epoxy resin and sliced to obtain a cross-section of the film which was analyzed by ATR Imaging using the IQ Mapping function. From the results of the ATR Imaging, it was determined that the medical packaging film consists of five layers and three components.ATR Imaging of a section of the medi-cal packaging film* Infrared polarizer is required.PL-IR-5000 Infrared polarizer for IRT-5000PL-IR-7000 Infrared polarizer for IRT-7000S/7000SpecificationsPolarizer: Wire-grid polarizerPolarizer angle control: 0 ~ 175° (1° step)SpecificationsIncident angle: 70°±10°Reflection: singleATR-5000-DATR-5000-G45 ATR-5000-Z* The optional pressure sensor is required.RFO-30-16R-AL 16× cassegrain objective, Al-coatedRFO-30-16R 16× cassegrain objective, Au-coatedRFO-30-32R-70AL 32× cassegrain objective, Al-coatedRFO-30-32R 32× cassegrain objective, Au-coatedRFO-30-10R-AL 10× cassegrain objective, Al-coatedRFO-30-10R-AU 10× cassegrain objective, Au-coatedRFO-30-16-57AL 16× Cassegrain pair, Al-coated (Standard for IRT-5000-16, IRT-7000S-16, IRT-7000)RFO-30-16-57 16× Cassegrain pair, Au-coatedRFO-30-32-70AL 32× Cassegrain pair, Al-coated (Standard for IRT-5000-32, IRT-7000S-32, IRT-7000)RFO-30-32-57 32× Cassegrain pair, Au-coatedRFO-30-10-45AL 10× Cassegrain pair, Al-coated (Standard for IRT-5000-10, IRT-7000S-10)RFO-30-10-45 10× Cassegrain pair, Au-coatedOBJ-5000-10 10× Objective (for sample observation)OBJ-5000-20 20× Objective (for sample observation)ATR-5000-SD1.0 ~ 1.57,000 ~ 2,5001,600 ~ 700Diamond2.4ATR-5000-SS1.0 ~ 1.57,000 ~ 70016ZnS2.2135.2ø500 µmPossible180 × 180ATR-5000-SG1.0 ~ 2.55,200 ~ 65064Ge4.0ø250 µmImpossible100 × 100SpecificationsApplicable sample refractive indexWavelength range (cm-1)MagnificationCrystal in raised (view) positionCrystal and sample contact (sample position)MaterialRefractive index (@ 1000 cm-1)Area in contact with sampleNumber of internal reflectionsATR crystal elementSimultaneous sample view when crystal is in contact with the sample surfaceIQ mapping area (µm)Expandability to customize the systemExpandability to customize the systemOptional FT-IR Microscope accessories Optional FT-IR Microscope accessories 8 9Variety of detectors for wavenumber extensionThe IRT-5000 and IRT-7000S employs a single element mid-band MCT detector as standard, while up to two detectors can be installed simultaneously to expand the spectral range of the microscope systems. Upon request, the standard mid-band MCT detector can be exchanged for a narrow or wide-band MCT detector as a factory option. The IRT-7000 offers two detectors as standard; a 16-channel linear array narrow-band MCT detector for infrared imaging and a single element mid-band MCT detector for single point measurements. A range of optional detectors are available to expand the spectral range of the microscope systems.TGS-5000C DLATGS detector with cassette for IRT-5000, range: 7800 ~ 400 cm-1 TGS-7000C DLATGS detector with cassette for IRT-7000S/7000, range: 7800 ~ 400 cm-1NMCT-5000C Narrow-band MCT detector with cassette for IRT-5000, range: 7800 ~ 750 cm-1NMCT-7000C Narrow-band MCT detector with cassette for IRT-7000S/7000, range: 7800 ~ 750 cm-1WMCT-5000C Wide-band MCT detector with cassette for IRT-5000, range: 7800 ~ 450 cm-1WMCT-7000C Wide-band MCT detector with cassette for IRT-7000S/7000, range: 7800 ~ 450 cm-1INSB-5000C InSb detector with cassette for IRT-5000, range: 15000 ~ 1850 cm-1INSB-7000C InSb detector with cassette for IRT-7000S/7000, range: 15000 ~ 1850 cm-1IGA-5000C InGaAs detector with cassette for IRT-5000, range: 12000 ~ 4000 cm-1IGA-7000C InGaAs detector with cassette for IRT-7000S/7000, range: 12000 ~ 4000 cm-1SDC-5000 Modification kit for the user-exchangeable second detector for IRT-5000SDC-7000 Modification kit for the user-exchangeable second detector for IRT-7000S/7000User-exchangeable second detectorsUser-exchangeable second detectors are available for the IRT-5000, 7000S and 7000 microscope systems. These detectors can be easily exchanged in a short time, at any time, as required by the user application. A modification kit for the main body of the microscope is required to use the user-exchangeable second detectors.User-exchangeable second detector with cassetteColor LCD monitorVIS-5000 Binocular for IRT-5000/7000S/7000A 5.7 inch TFT color LCD monitor can be installed in the microscope system, providing a sample view for sample positioning/area selection and simultaneous observation during data collection. LCD-5000 * The color LCD monitor and visual binocular cannot be installed simultaneously. Neither option can be used with a vacuum type microscope.PL-E-5000 Visible PolarizerPL-E-5000VIS Visible PolarizerPL-E-5000FV Visible PolarizerPolarized illumination light heightens the observation of materials such as single crystals, minerals or other foreign objects inside a polymer film which are otherwise difficult to observe using the standard visible illumination.Normal observation Polarization observationStretched vinyl ropeFor colorless or transparent samples, light and dark interference patterns from the sample can be used to highlight and observe the sample image as a stereoscopically bright image with shading. Normal observationThe IRT-5000/7000S/7000 systems have a nitrogen purge capability as standard. An optional purge casing for the sample stage area is available for further elimination of the influence of CO2 and water vapor bands.The MHC-5000 and 7000 offer the ability to measure infrared spectral changes due to phase transitions of the sample during controlled heating/cooling of the sample. The temperature control program is available as an option.Temperature rangeMHC-5000: Room temp. ~ 600°C (standard), -190 ~ 600°C (option)MHC-7000: Room temp. ~ 375°C (standard), -60 ~ 375°C (option)Purge case Sample temperature control system Sample observation optionsIPS-5000 XYZ Auto-stageXYZ Auto-stage and joystickAn optional automatic X-Y-Z sample stage for the IRT-5000 enables auto-focus and mapping analysis of large sample areas. The joystick option for the IRT-5000/7000S/7000 systems provides an alternative control method for stage movement and sample positioning when using the auto-stage.IPS-5000 XYZ Auto-stage option for IRT-5000JOY-IPS-5000 Joystick option for IRT-5000/7000S/7000PGC-5000 Purge case for IRT-5000PGC-7000 Purge case for IRT-7000MHC-5000 Heating System MHC-7000 Heating SystemLCD-5000 Color LCD Monitor for IRT-5000/7000S/7000BinocularPolarization observationA binocular option, with 10× oculars, enables direct visual observation of the sample with the ATOS system. Normal observation Fluorescence observationComplex of protein and sugarJOY-IPS-5000 JoystickIntegrated detectorsVIS-5000 * When a linear array detector is added to the IRT-5000 after installing the PGC-5000 purge case, the PGC-5000UPG purge case upgrade kit is also required.* When using the manual stage, only the 10× cassegrain objective can be used with the temperature control system due to limitations in the working distance. For the auto-stage, the 10× or 16× cassegrain objectives can be used.DIC-5000 Selecting specific excitation and emission wavelengths, fluorescent portions of a sample can be vividly observed as a visible image, thus highlighting specific sample features of interest.Excitation and emission filters and dichroic mirror for MF-5000VISOptional single element detectors (integrated) for IRT-5000/7000S/7000Optional linear array detectors (integrated) for IRT-7000User-exchangeable second detectorsModification kitDifferential interference contrast observation* 10× objective (observation) and Visible Polarizer are required.* 20× objective (observation) cannot be used with the DIC-5000 option * Both PL-E-5000 and PL-E-5000VIS are required when using the VIS-5000 binocular.* PL-E-5000FV (factory option) needs to be used for a vacuum type FT-IR microscope.Fluorescence observation MF-5000VIS Fluorescence observationMF-5000UV Fluorescence observationDifferential interference contrast observation DIC-5000 Differential interference contrast observation-25610-25800-26000Y [µm]X [µm]-26200-263601680 2000 2200 2400 2680-25830-25900-26000Y [µm]X [µm]-26100-261451965 2100 2200 2300 2390BAAnalysis of complex of protein and sugarTGS-5000 DLATGS detector, range: 7800 ~ 400 cm-1NMCT-5000 Narrow-band MCT detector, range: 7800 ~ 750 cm-1WMCT-5000 Wide-band MCT detector, range: 7800 ~ 450 cm-1INSB-5000 InSb detector, range: 15000 ~ 1850 cm-1IGA-5000 InGaAs detector, range: 12000 ~ 4000 cm-1MNMCT-7000 Linear array Narrow-band detector (2 × 16 element), range: 7000 ~ 750 cm-1MINSB-7000 Linear array InSb detector (1 × 16 element), range: 10000 ~ 1900 cm-1MIGA-7000 Linear array InGaAs detector (1 × 16 element), range: 10000 ~ 5000 cm-1SpecificationsLight source: Xe lamp, 75WMF-5000VIS400 ~ 700 nm400, 480 nm (Band-pass filter) (Max. 5 filters can be mounted.)540, 600, 700 nm (Band-pass filter) (Max. 5 filters can be mounted.)506 nmCooled CCD cameraHg-Xe lamp, 150WMF-5000UV250 ~ 700 nm330, 400, 480 nm (Band-pass filter) (Max. 5 filters can be mounted.)450, 540, 600, 700 nm (Band-pass filter) (Max. 5 filters can be mounted.)409 and 506 nmCooled CCD camera for UV-VisFluorescence excitation/emission range:Excitation wavelength:Emission wavelength:Dichroic mirror:Observation camera:7054000 10002000AbsWavenumber [cm-1]0.1AB SugarProteinFlexibility, reliability and accuracy, saving time and cost of analysisFlexibility, reliability and accuracy, saving time and cost of analysisFT-IR Microscope sampling tools FT-IR Microscope sampling tools A range of infrared microscopes for any application requirementA range of infrared microscopes for any application requirementOrdering informationOrdering information10 11Sample compartment microscope for FT-IRThe IRT-1000 sample compartment microscopy system is designed to provide affordable analysis of microscopic samples with the high performance features of an external FT-IR microscope accessory. The IRT-1000 offers unprecedented convenience and ease of use in conjunction with the JASCO FT/IR-4000 and 6000 Series FT-IR instruments. The microscope accessory installs into the spectrometer sample compartment in seconds without optical alignment.SpecificationsDiamond holder size: 43 dia. × 2.5 thickness mmRequired working distance: more than 5.5 mmWhen measuring a sample with transmittance mode, a sample thickness less than 1 µm and a smooth surface are preferable for a high quality spectrum. The Diamond Window is very effective to compress thick samples.This kit includes tools for micro sample preparations such as removal of tiny foreign substances or placement of thin slices on a sample plate.SpecificationsDiamond size: 2.5 dia. × 0.5 thickness mm (JDW-200) 3.5 dia. × 0.5 thickness mm (JDW-300)These gold reference mirrors are used as the reference for IR reflection measurements. They can also be used as reference materials for grazing-angle measurements.The mini KBr/KCl plates are disposable windows used for the KBr pellet method, in which a sample is placed on KBr or KCl crystals and formed into a pellet for transmittance measurements. For measurement of chloride containing compounds that may be influenced by halogen exchange, the mini KCl plate is recommended.Cross sectional analysis of the leaf of a Cyclamen houseplantThe leaf sample was sliced using the HW-1 Multi-angle slicer, and placed between two KBr plates to create a pellet (KBr plate method). The sample pellet was measured using the IRT-5000 with the IQ Mapping function (left side) and the IRT-7000 with the high-speed imaging function (right side). 3D display(Peak height at 1050 cm-1) Mini KBr/KCl plates IRT-5000 Infrared Microscope IRT-7000S Fully Automated IR Microscope IRT-7000 IRT-1000 (Irtronµ) Multi-channel IR Microscope * The INA-D137 can not be used with the combination of 32× Cassegrain and an auto-stage.ABSample imageDCSample image1050 cm-1ABDistribution of lipid (red) and protein (green) (peak height at 1735 cm-1 and 1540 cm-1) Standard configurationRight-side position type for instrument systems with FT-RamanFull vacuum typeUpgrade kitUPG-5000 Upgrade kit to IRT-7000 for IRT-5000Standard configurationUpgrade kitUPG-7000S Upgrade kit to IRT-7000 for IRT-7000SStandard configurationIRT-7000 Multichannel Infrared Microscope, 16× and 32× Cassegrain objectives, with array detectorFull vacuum typeIRT-7000VC IRT-7000, full vacuum typeSpecificationsComposition: 10 pcs/setSize (entire body): 25 × 65 mmSize (mirror): 5, 15 and 10 mm diameterCoating layer: Surface layer Au (50 µm)Gold-coated reference mirrorsMini KBr plates, 3W × 3D × 0.5H mm, 200 pcs/set(P/N: 2000-0060)Mini KCl plates, 3W × 3D × 0.5H mm, 100 pcs/set (P/N: 2000-0066)HS-1 Vertical slicerCutting angle: 90° (against the surface of the sample)Sample thickness: Max. 3 mmHK-1 Angled slicerCutting angle: 15° (against the surface of the sample)Sample thickness: Max. 0.2 mmHW-1 Multi-angle slicerCutting angle: 45°~ 90° (against the surface of the sample)Sample thickness: Max. 2 mmPrecision cutting from 10-200 microns Window for transmission measurementsFor reflection measurementsReference mirrorsTo compress and flatten solid samplesThe SliceMaster is a handy compact slicer that can create thin sections quickly and easily. It is a powerful tool for multi-layer film analysis and/or cross sectional analysis. Three models are available, and can be selected for different sample preparation capabilities.HW-1 JDW-200JDW-300INA-D137SliceMasterJDW-200 Diamond WindowJDW-300 Diamond WindowDiamond sample windowMicro sampling tool kit INA-D137 Diamond EX’PressCD1735 cm-11540 cm-1Wavenumber [cm-1] Wavenumber [cm-1]4000Abs Abs2000 1000 4000 2000 1000 750650IRT-5000-16 IRT-5000 Infrared Microscope, 16× CassegrainIRT-5000-32 IRT-5000 Infrared Microscope, 32× CassegrainIRT-5000-10 IRT-5000 Infrared Microscope, 10× CassegrainIRT-5000-16R IRT-5000 Infrared Microscope, 16× Cassegrain IRT-5000-32R IRT-5000 Infrared Microscope, 32× CassegrainIRT-5000-10R IRT-5000 Infrared Microscope, 10× CassegrainIRT-5000-16VC IRT-5000 Infrared Microscope, full vacuum type, 16× CassegrainIRT-5000-32VC IRT-5000 Infrared Microscope, full vacuum type, 32× CassegrainIRT-5000-10VC IRT-5000 Infrared Microscope, full vacuum type, 10× CassegrainIRT-7000S-16 IRT-7000S Fully automated Infrared Microscope, 16× CassegrainIRT-7000S-32 IRT-7000S Fully automated Infrared Microscope, 32× CassegrainIRT-7000S-10 IRT-7000S Fully automated Infrared Microscope, 10× CassegrainIRT-5000 with the FT/IR-4100 FT-IR SpectrometerIRT-5000 with the FT/IR-6100 FT-IR SpectrometerIRT-7000 with the FT/IR-4100 FT-IR SpectrometerIRT-7000 with the FT/IR-6100 FT-IR SpectrometerSmartPurge TMAn optional purge casing can be used to eliminate interference from atmospheric CO2 and water vapor bands.ATR objectiveThree types of optional ATR objectives are available, selecting from ZnSe, Ge, and Diamond crystal elements. An optional pressure sensor (recommended) to protect the ATR objective is also available.Powder sample holderThe powder sample holder can be used for diffuse reflectance measurements of powdered samples mixed with KBr. Up to five samples can be loaded onto the holder.Liquid sample holderThe liquid sample holder includes three standard spacers, 0.1, 0.05 and 0.025 mm pathlengths for liquid sample analyses. Transmittance, reflectance and ATR (option) measurement modesDLATGS, MCT or NIR optimized detectorUnique SmartMonitorTM function allows sample observation during spectrum previewFive inch TFT LCD monitor for sample observationOptional sampling accessories for liquid and powder samplesAffordable, easy-to-use microscopy systemOptions for IRT-100012 3 4 5 671234567Configuration• 3-position sample holder• Micro sampling knife, H-type• Micro sampling knife, S-type• Sample manipulation micro-needle• Tweezers for KBr plates• KBr plate for micro sampling, 5 × 5 × 1 mm, 5 pcs/set• Tweezers for micro sampling• Reference mirror for micro-reflection measurements• KBr plate, ø10 × 0.1 mm, 5 pcs/set* This kit is a standard accessory for the IRT-5000/7000S/7000.* A ø5 micro pellet die and a hand press are required.* A gold-coated mirror is included in the standard kit for the IRT-5000/7000S/7000. 01_12_CS3_H 02_03_CS3_G 04_05_CS3_J 06_07_CS3_I 08_09_CS3_J 10_11_CS3_K.pdf
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