Raman NRS-5000 Series

Laser Raman SpectrometersJASCO INTERNATIONAL CO., LTD.4-21, Sennin-cho 2-chome, Hachioji, Tokyo 193-0835, Japan Tel: +81-42-666-1322 Fax: +81-42-665-6512 http://www.jascoint.co.jp/english/Australia, China, Hong Kong, India, Indonesia, Iran, Korea, Malaysia, New Zealand, Pakistan, Philippines, Russia, Singapore, South Africa, Taiwan, ThailandJASCO EUROPE s.r.l. Via Luigi Cadorna 1, 23894 Cremella (Lc), Italy Tel: +39-039-9215811 Fax: +39-039-9215835 http://www.jasco-europe.com JASCO Deutschland www.jasco.de, JASCO UK www.jasco.co.uk, JASCO France www.jascofrance.fr, JASCO Benelux www.jasco.nl, JASCO Spain www.jasco-spain.com, JASCO Scandinavia www.jascoscandinavia.seAustria, Finland, Greece, Hungary, Poland, Portugal, Romania, Switzerland, Algeria, Cyprus, Egypt, Israel, Jordan, Kuwait, Lebanon, Morocco, Saudi Arabia, Syria, Tunisia, Turkey, U.A.E., YemenJASCO INCORPORATED28600 Mary's Court, Easton, MD 21601, U.S.A Tel:+1-800-333-5272 +1-410-822-1220 Fax:+1-410-822-7526 http://www.jascoinc.comCanada, Costa Rica, Mexico, Puerto Rico, Argentina, Brazil, Chile, Colombia, Paraguay, Peru, Uruguay, GuatemalaSpecifications are subject to change without notice.For more information, please contact:NRSB-1005 Printed in JAPANJASCO International Co., Ltd.SpecificationsSpectrograph (Focal length)Scanning mechanismLow wavenumber attachmentWavenumber range (Raman shift)Maximum resolutionGratingMax. No. of mountable gratingUV upgradeRejection filterRejection filter switchingBeam splitterStandard detector Optional detectorsDual detector switchingLaserMaximum numberof laser mounted at a time Microscopic observationConfocal opticsDSF (Dual Spatial Filter)SRl (Spatial Resolution Image)ObjectivesStandard sample stageOptional sample stagesSPRIntS imagingAutostage imagingMacro measurement unitAuto-alignment featureSGI (slit guide image)Neon lampSafety featureStandard functionFunctions included inSPRIntS imaging and autostage imagingOptional programsAnti-vibration table *9Dimensions & Weight(Main unit only)Power requirementSpectrographDetectorLaserMicroscope SoftwareAberration-corrected Czerny-Turner monochrometer (f = 500 mm)Aberration-corrected Czerny-Turner monochrometer (f = 300 mm)NRS-5100 NRS-5200 NRS-7100 NRS-7200High-precision direct driveNoneStandard (Excitation WL: 400 ~ 800 nm)Standard (Excitation WL: 400 ~ 800 nm)None50 ~ 8000 cm-1 *1 10 ~ 8000 cm-1 *2 50 ~ 8000 cm-1 *1 5 ~ 8000 cm-1 *21 cm-1 (532 nm excitation, 1800 gr/mm, 1024 pixel CCD)0.4 cm-1 optional (532 nm excitation, 2400 gr/mm, 2048 pixel CCD)0.7 cm-1 (532 nm excitation, 1800 gr/mm, 1024 pixel CCD)0.3 cm-1 optional (532nm excitation, 2400 gr/mm, 2048 pixel CCD)1800 gr/mm (Option: 3600, 2400, 1200, 600, 300, 150 gr/mm)3 4Factory option for UV laser excitation (including UV optical elements and UV light observation camera) *3532 nm notch filter (Option: Notch filters and edge filters for other excitation wavelengths)Manual exchange (Option: automated 8-position switching mechanism)Beam splitter with automated switching mechanism (Option: Dichroic Mirrors, Max. 2 dichroic mirrors can be mounted) *44-stage Peltier cooled CCD detector (UV-NIR range, 1024 × 255 pixel)4-stage Peltier cooled CCD detector (high-resolution, 2048 × 512 pixel), Liquid-nitrogen-cooled InGaAs detector (for 1064 nm excitation laser, 1024 pixel)Factory option (required when using 2 detectors)532 nm, 50 mW (Option: 244 *5, 266 *5, 325 *5, 355 *5, 442, 488, 514.5, 633, 660, 785, 1064 nm)Internal: Max. 2*6, External: Max. 6 (VIS-NIR laser: Max. 3, UV laser: Max. 3), Total: Max. 8 lasers, 9 wavelengthsStandard:High-resolution built-in CMOS camera (Option:binocular, trinocular, polarization observation, differential interference, transmission illumination)StandardStandard *Not available for UV upgraded modelStandard *Not available for UV upgraded model5×, 20×, 100× objectives (Option: Long working distance type, UV type, NIR type)Manual XYZ stage (operable distance X: 75, Y: 50, Z: 30 mm)XY autostage with joystick accessory (travel range X:100, Y:70 mm, 0.04 µm step), Z autostage (travel range Z:30 mm, 0.1 µm step)Factory option (including VertiScan, high-speed data import, 3D imaging measurement, Z autostage, autofocus function)Factory option (including imaging measurement, 3D imaging measurement, XYZ autostage, autofocus function)Factory option (SPRIntS imaging system and the Macro measurement unit cannot be provided simultaneously)Laser beam auto-alignment, Raman scattering auto-alignmentStandardStandard (for wavenumber correction)Integrated sample chamber laser interlock, laser light-path protection (Class 1 compliance)Point measurement, wide spectral-band measurement, basic spectral data processing functions, search/functional group analysis (Sadtler KnowItAll),cosmic-ray removal, auto-fluorescence-correction, wavenumber correction, sensitivity correction, JASCO canvas (printing function), validation, user help functionOmnifocal image, Real-time display of spectrum, chemical image and current measurement point, multi-image map,auto-focus (supporting both sample image contrast and laser focus algorithms), imaging analysis (including Peak height (ratio), Peak area (ratio), Peak shift,PWHH), PCA mapping, 3-D imaging (including 3-D Raman image display, 3-D image slice display)High-throughput screening measurement *7, interval measurement analysis, stress analysis *8, carbon analysis, polysilicon crystallinity evaluation, 2D correlationOption (air source for anti-vibration table: nitrogen gas or air source, secondary pressure 0.25 - 0.3 MPa)880(W) × 890(D) × 670(H) mmAbout 200 kg1360(W) × 890(D) × 670(H) mmAbout 240 kg1060(W) × 1220(D) × 670(H) mmAbout 230 kg1540(W) × 122 (D) × 670(H) mmAbout 270 kgAC100 V ±10 V, 200 V ±20 V, 200 VA*1 At 532 nm excitation wavelength with the standard rejection filter.*2 At 532 nm excitation wavelength with the low wavenumber attachment.*3 UV laser, edge filter for UV laser, and UV objectives are additionally required.*4 One dichroic mirror can be mounted when either the UV upgrade or the SPRIntS imaging option is configured. No dichroic mirror can be utilized when both the UV upgrade and the SPRIntS imaging options are fitted.*5 The specifications are partially different from the standard model when UV laser is used.*6 The laser may not be internally mounted due to the specification of the laser.*7 Autostage imaging option is required.*8 SPRIntS imaging option or autostage imaging option is required.*9 Raman system must be placed on anti-vibration or equivalent table.NRS-5000/7000 SeriesNRS-5000/7000 SeriesHigh performance Raman microscopy systems NRS-5100 Maximum Resolution: 1 cm-1/ 0.4 cm-1(optional)Measurement range: 50 to 8000 cm-1NRS-5200 Maximum Resolution: 1 cm-1/ 0.4 cm-1(optional)Measurement range: 10 to 8000 cm-1NRS-7100 Maximum Resolution: 0.7 cm-1/ 0.3 cm-1(optional)Measurement range: 50 to 8000 cm-1NRS-7200 Maximum Resolution: 0.7 cm-1/ 0.3 cm-1(optional)Measurement range: 5 to 8000 cm-1Laser Raman SpectrometersNRS-5000 SeriesNRS-7000 SeriesNRS-5000/7000 Series features1064 nm laser and InGaAs detector options for fluorescence free measurementsUnique DFS function for high spatial resolutionThe performance and functions expected on a micro-Raman spectrometer are all provided with the NRS-5000/7000 series Raman systems, assuring consistent performance for rapid acquisition of high quality data with automated system control and minimal optical adjustments.For application expansion, an automated multi-grating turret, up to 2 detectors and a maximum of 8 lasers ranging from the UV through the NIR are capable of integration with the instrument system, all optical components are PC controlled for maximum flexibility with minimum user interaction.Spectra Manager IIfor system control, data acquisition, and data analysis1000060000200003000040000500002500 20010002000Int.Raman Shift [cm-1]Beforefluorescence-correctionAfterfluorescence-correction 1-click Fluorescence removal by Auto Fluorescence correction functionSpectra Manager II for the NRS-5000/7000 offers revolutionary features to simplify previously difficult measurement and analysis tasks, while adding various user-support tools such as auto-fluorescence-correction, wavenumber correction, intensity correction, and a novel user-advice function. With a graphical user interface, the Raman microscope analysis program offers maximum ease of use for microscopic measurements.- An image of each measurement point can be saved as a thumbnail image, displayed at the bottom of the screen, and linked with the measurement point - User advice functions to obtain optimized measurement conditions- Suitable data collection parameters advised through real-time analysis of preview spectra.- Sadtler KnowItAll, a highly acclaimed spectral library search software, is provided as standard.- New multi-focus function allows creation of an "omnifocal image" from several images with different focal depths. By using the simultaneously obtained Z-axis information, a 3-dimensional video image can be created.Research-grade model assuring high spectral qualityExceptional wavenumber accuracy with a high-precision rotary-encoder direct drive mechanismLow wavenumber measurement (NRS-5200/7200)Auto-alignment of microscope laser introduction optics and Raman scattering light path Wavenumber calibration using an integrated Ne lampUnique Dual Spatial Filter (DSF) for higher spatial resolution than conventional confocal opticsPatented Spatial Resolution Image (SRI) function for simultaneous observation of sample image, laser spot and aperture imageFull range of options including macro-Raman measurement unit and fiber optic probes2003500 100020003000Intensity (a.u.)Raman Shift (cm-1)Sample: Rubber1064 nm785 nmAll models can integrate Near-IR excitation lasers, especially useful for samples which generate fluorescence, even when excited using 785 nm.Unique DFS function provides higher spatial resolution than normal confocal optics to irradiate only the target sample.From high resolution measurements to high-speed imagingHigh speed imaging for a large spatial sample by using the SPRIntS and auto-stage imaging capabilities 10 mmExcipientActive ingredient Raman image of active ingredient in analgesic drug Sample image of a pharmaceutical tabletAccurate 3-D Imaging by the distortion-free VertiScan function3-D Raman image display 3-D image slice display Titanium oxideSiPolymerSPRIntS High Speed Imaging system("SPRIntS": Software Programmable Raman Integration Speed)High-resolution imaging of a small area at sub-micron scale using the SPRIntS imaging capabilities without an auto-stage SPRIntS imaging is a laser scanning function which supports high speed measurements by scanning the laser excitation beam using individual scan mirrors (VertiScan) to irradiate the sample while collecting data from a high-speed CCD detector at a minimum of every 5 milliseconds. The VertiScan function also supports a 3-D imaging function by utilizing the Z-autostage and the confocal capability of the instrument system. The VertiScan system is unlike other laser scanning functions because the sample is illuminated with a vertical laser beam every time to retain measurement confocality and obtain a high quality, undistorted Raman image.The matrix area surrounding a 1.5 µm diameter hole formed on a Si wafer was measured using a 40 nm stepping function. The 1.5 µm feature could be easily observed in the Raman image.Raman ImagingThis function acquires depth imaging data from a sample using the confocal capability of the Raman spectrometer and creates a 3-D image from the Raman intensity data. Multilayer sample analysis is also possible using this function.A 10 mm diameter area of a pharmaceutical tablet was measured in just 15 minutes by using the SPRIntS and auto-stage imaging capabilities.Microscope image3800intensity (a.u.)3000Raman Shift [cm-1]2000 1000 400Without DSFDiamond(1333 cm-1)With DSFSample: Nano diamond on fluorescent plasticX [µm]0 1 2 3 418504.5012344.51.5 µm1050-5-10-10 -5 0 5 10X [µm]Y [µm]