Raman NRS-7000 Series Brochure

Laser Raman Spectrometers JASCO INTERNATIONAL CO., LTD. 4-21, Sennin-cho 2-chome, Hachioji, Tokyo 193-0835, Japan Tel: +81-42-666-1322 Fax: +81-42-665-6512 http://www.jascoint.co.jp/english/ Australia, China, Hong Kong, India, Indonesia, Iran, Korea, Malaysia, New Zealand, Pakistan, Philippines, Russia, Singapore, South Africa, Taiwan, Thailand JASCO EUROPE s.r.l. Via Luigi Cadorna 1, 23894 Cremella (Lc), Italy Tel: +39-039-9215811 Fax: +39-039-9215835 http://www.jasco-europe.com JASCO Deutschland www.jasco.de, JASCO UK www.jasco.co.uk, JASCO France www.jascofrance.fr, JASCO Benelux www.jasco.nl, JASCO Spain www.jasco-spain.com, JASCO Scandinavia www.jascoscandinavia.se Austria, Finland, Greece, Hungary, Poland, Portugal, Romania, Switzerland, Algeria, Cyprus, Egypt, Israel, Jordan, Kuwait, Lebanon, Morocco, Saudi Arabia, Syria, Tunisia, Turkey, U.A.E., Yemen JASCO INCORPORATED 28600 Mary's Court, Easton, MD 21601, U.S.A Tel:+1-800-333-5272 +1-410-822-1220 Fax:+1-410-822-7526 http://www.jascoinc.com Canada, Costa Rica, Mexico, Puerto Rico, Argentina, Brazil, Chile, Colombia, Paraguay, Peru, Uruguay, Guatemala Specifications are subject to change without notice. For more information, please contact: NRSB-1005 Printed in JAPAN JASCO International Co., Ltd. Specifications Spectrograph (Focal length) Scanning mechanism Low wavenumber attachment Wavenumber range (Raman shift) Maximum resolution Grating Max. No. of mountable grating UV upgrade Rejection filter Rejection filter switching Beam splitter Standard detector Optional detectors Dual detector switching Laser Maximum number of laser mounted at a time Microscopic observation Confocal optics DSF (Dual Spatial Filter) SRl (Spatial Resolution Image) Objectives Standard sample stage Optional sample stages SPRIntS imaging Autostage imaging Macro measurement unit Auto-alignment feature SGI (slit guide image) Neon lamp Safety feature Standard function Functions included in SPRIntS imaging and autostage imaging Optional programs Anti-vibration table *9 Dimensions & Weight (Main unit only) Power requirement Spectrograph Detector Laser Microscope Software Aberration-corrected Czerny-Turner monochrometer (f = 500 mm)Aberration-corrected Czerny-Turner monochrometer (f = 300 mm) NRS-5100 NRS-5200 NRS-7100 NRS-7200 High-precision direct drive None Standard (Excitation WL: 400 ~ 800 nm) Standard (Excitation WL: 400 ~ 800 nm) None 50 ~ 8000 cm-1 *1 10 ~ 8000 cm-1 *2 50 ~ 8000 cm-1 *1 5 ~ 8000 cm-1 *2 1 cm-1 (532 nm excitation, 1800 gr/mm, 1024 pixel CCD) 0.4 cm-1 optional (532 nm excitation, 2400 gr/mm, 2048 pixel CCD) 0.7 cm-1 (532 nm excitation, 1800 gr/mm, 1024 pixel CCD) 0.3 cm-1 optional (532nm excitation, 2400 gr/mm, 2048 pixel CCD) 1800 gr/mm (Option: 3600, 2400, 1200, 600, 300, 150 gr/mm) 3 4 Factory option for UV laser excitation (including UV optical elements and UV light observation camera) *3 532 nm notch filter (Option: Notch filters and edge filters for other excitation wavelengths) Manual exchange (Option: automated 8-position switching mechanism) Beam splitter with automated switching mechanism (Option: Dichroic Mirrors, Max. 2 dichroic mirrors can be mounted) *4 4-stage Peltier cooled CCD detector (UV-NIR range, 1024 × 255 pixel) 4-stage Peltier cooled CCD detector (high-resolution, 2048 × 512 pixel), Liquid-nitrogen-cooled InGaAs detector (for 1064 nm excitation laser, 1024 pixel) Factory option (required when using 2 detectors) 532 nm, 50 mW (Option: 244 *5, 266 *5, 325 *5, 355 *5, 442, 488, 514.5, 633, 660, 785, 1064 nm) Internal: Max. 2*6, External: Max. 6 (VIS-NIR laser: Max. 3, UV laser: Max. 3), Total: Max. 8 lasers, 9 wavelengths Standard:High-resolution built-in CMOS camera (Option:binocular, trinocular, polarization observation, differential interference, transmission illumination) Standard Standard *Not available for UV upgraded model Standard *Not available for UV upgraded model 5×, 20×, 100× objectives (Option: Long working distance type, UV type, NIR type) Manual XYZ stage (operable distance X: 75, Y: 50, Z: 30 mm) XY autostage with joystick accessory (travel range X:100, Y:70 mm, 0.04 µm step), Z autostage (travel range Z:30 mm, 0.1 µm step) Factory option (including VertiScan, high-speed data import, 3D imaging measurement, Z autostage, autofocus function) Factory option (including imaging measurement, 3D imaging measurement, XYZ autostage, autofocus function) Factory option (SPRIntS imaging system and the Macro measurement unit cannot be provided simultaneously) Laser beam auto-alignment, Raman scattering auto-alignment Standard Standard (for wavenumber correction) Integrated sample chamber laser interlock, laser light-path protection (Class 1 compliance) Point measurement, wide spectral-band measurement, basic spectral data processing functions, search/functional group analysis (Sadtler KnowItAll), cosmic-ray removal, auto-fluorescence-correction, wavenumber correction, sensitivity correction, JASCO canvas (printing function), validation, user help function Omnifocal image, Real-time display of spectrum, chemical image and current measurement point, multi-image map, auto-focus (supporting both sample image contrast and laser focus algorithms), imaging analysis (including Peak height (ratio), Peak area (ratio), Peak shift, PWHH), PCA mapping, 3-D imaging (including 3-D Raman image display, 3-D image slice display) High-throughput screening measurement *7, interval measurement analysis, stress analysis *8, carbon analysis, polysilicon crystallinity evaluation, 2D correlation Option (air source for anti-vibration table: nitrogen gas or air source, secondary pressure 0.25 - 0.3 MPa) 880(W) × 890(D) × 670(H) mm About 200 kg 1360(W) × 890(D) × 670(H) mm About 240 kg 1060(W) × 1220(D) × 670(H) mm About 230 kg 1540(W) × 122 (D) × 670(H) mm About 270 kg AC100 V ±10 V, 200 V ±20 V, 200 VA *1 At 532 nm excitation wavelength with the standard rejection filter. *2 At 532 nm excitation wavelength with the low wavenumber attachment. *3 UV laser, edge filter for UV laser, and UV objectives are additionally required. *4 One dichroic mirror can be mounted when either the UV upgrade or the SPRIntS imaging option is configured. No dichroic mirror can be utilized when both the UV upgrade and the SPRIntS imaging options are fitted. *5 The specifications are partially different from the standard model when UV laser is used. *6 The laser may not be internally mounted due to the specification of the laser. *7 Autostage imaging option is required. *8 SPRIntS imaging option or autostage imaging option is required. *9 Raman system must be placed on anti-vibration or equivalent table. NRS-5000/7000 Series NRS-5000/7000 Series High performance Raman microscopy systems NRS-5100 Maximum Resolution: 1 cm-1/ 0.4 cm-1(optional) Measurement range: 50 to 8000 cm-1 NRS-5200 Maximum Resolution: 1 cm-1/ 0.4 cm-1(optional) Measurement range: 10 to 8000 cm-1 NRS-7100 Maximum Resolution: 0.7 cm-1/ 0.3 cm-1(optional) Measurement range: 50 to 8000 cm-1 NRS-7200 Maximum Resolution: 0.7 cm-1/ 0.3 cm-1(optional) Measurement range: 5 to 8000 cm-1 Laser Raman Spectrometers NRS-5000 Series NRS-7000 Series NRS-5000/7000 Series features 1064 nm laser and InGaAs detector options for fluorescence free measurements Unique DFS function for high spatial resolution The performance and functions expected on a micro-Raman spectrometer are all provided with the NRS-5000/7000 series Raman systems, assuring consistent performance for rapid acquisition of high quality data with automated system control and minimal optical adjustments. For application expansion, an automated multi-grating turret, up to 2 detectors and a maximum of 8 lasers ranging from the UV through the NIR are capable of integration with the instrument system, all optical components are PC controlled for maximum flexibility with minimum user interaction. Spectra Manager II for system control, data acquisition, and data analysis 10000 60000 20000 30000 40000 50000 2500 20010002000 Int. Raman Shift [cm-1] Before fluorescence-correction After fluorescence-correction 1-click Fluorescence removal by Auto Fluorescence correction function Spectra Manager II for the NRS-5000/7000 offers revolutionary features to simplify previously difficult measurement and analysis tasks, while adding various user-support tools such as auto-fluorescence-correction, wavenumber correction, intensity correction, and a novel user-advice function. With a graphical user interface, the Raman microscope analysis program offers maximum ease of use for microscopic measurements. - An image of each measurement point can be saved as a thumbnail image, displayed at the bottom of the screen, and linked with the measurement point - User advice functions to obtain optimized measurement conditions - Suitable data collection parameters advised through real-time analysis of preview spectra. - Sadtler KnowItAll, a highly acclaimed spectral library search software, is provided as standard. - New multi-focus function allows creation of an "omnifocal image" from several images with different focal depths. By using the simultaneously obtained Z-axis information, a 3-dimensional video image can be created. Research-grade model assuring high spectral quality Exceptional wavenumber accuracy with a high-precision rotary-encoder direct drive mechanism Low wavenumber measurement (NRS-5200/7200) Auto-alignment of microscope laser introduction optics and Raman scattering light path Wavenumber calibration using an integrated Ne lamp Unique Dual Spatial Filter (DSF) for higher spatial resolution than conventional confocal optics Patented Spatial Resolution Image (SRI) function for simultaneous observation of sample image, laser spot and aperture image Full range of options including macro-Raman measurement unit and fiber optic probes 2003500 100020003000 In te ns ity ( a. u. ) Raman Shift (cm-1) Sample: Rubber 1064 nm 785 nm All models can integrate Near-IR excitation lasers, especially useful for samples which generate fluorescence, even when excited using 785 nm. Unique DFS function provides higher spatial resolution than normal confocal optics to irradiate only the target sample. From high resolution measurements to high-speed imaging High speed imaging for a large spatial sample by using the SPRIntS and auto-stage imaging capabilities 10 mm Excipient Active ingredient Raman image of active ingredient in analgesic drug Sample image of a pharmaceutical tablet Accurate 3-D Imaging by the distortion-free VertiScan function 3-D Raman image display 3-D image slice display Titanium oxide Si Polymer SPRIntS High Speed Imaging system ("SPRIntS": Software Programmable Raman Integration Speed) High-resolution imaging of a small area at sub-micron scale using the SPRIntS imaging capabilities without an auto-stage SPRIntS imaging is a laser scanning function which supports high speed measurements by scanning the laser excitation beam using individual scan mirrors (VertiScan) to irradiate the sample while collecting data from a high-speed CCD detector at a minimum of every 5 milliseconds. The VertiScan function also supports a 3-D imaging function by utilizing the Z-autostage and the confocal capability of the instrument system. The VertiScan system is unlike other laser scanning functions because the sample is illuminated with a vertical laser beam every time to retain measurement confocality and obtain a high quality, undistorted Raman image. The matrix area surrounding a 1.5 µm diameter hole formed on a Si wafer was measured using a 40 nm stepping function. The 1.5 µm feature could be easily observed in the Raman image. Raman Imaging This function acquires depth imaging data from a sample using the confocal capability of the Raman spectrometer and creates a 3-D image from the Raman intensity data. Multilayer sample analysis is also possible using this function. A 10 mm diameter area of a pharmaceutical tablet was measured in just 15 minutes by using the SPRIntS and auto-stage imaging capabilities. Microscope image 3800 in te ns ity ( a. u. ) 3000 Raman Shift [cm-1] 2000 1000 400 Without DSF Diamond (1333 cm-1) With DSF Sample: Nano diamond on fluorescent plastic X [µm] 0 1 2 3 4 18 50 4.5 0 1 2 3 4 4.5 1.5 µm 10 5 0 -5 -10 -10 -5 0 5 10 X [µm] Y [µ m ]