Focused Photonics Inc. (FPI)
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- FPI - Model AMMS-100 XRF - Ambient ...
FPI - Model AMMS-100 XRF -Ambient Metal Analyzer
The system integrates X-ray fluorescence for metal analysis up to 30 elements and a beta-ray attenuation model for particulate mass monitoring. But module will be using the same sample moving sequentially across the detector and would be significantly effective in industry emission tracing.
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XRF monitoring
particulate monitoring
particulate matter
ambient particulate
heavy metals
heavy metals monitoring
fluorescence monitoring
analysis system
toxic metal
air particulate
- Measuring 30 toxic metals simultaneously;
- Magnitude of detection limit 0.01-0.1 ng/m3 level;
- Nondestructive test that the membrane sample can be preserved;
- Associate measurements with the time of day or meteorological conditions make particular source tracing possible;
- Continuous monitoring results in a large database that can conduct source modeling;
- No consumable except filter tape replacement, no laboratory analysis, unattended online monitoring results in cost reduction and time-saving;
- Measurement Method of Particulate Matter: Beta-Ray attenuation
- Measurement Method of Heavy Metal Element: X-Ray fluorescence
- Measurement Range of Particulate Matter: 0~1,2,5,10mg/m3
- Measurement Range of Heavy Metal Element: 0~100μg/m3
- Detection Limit of Particulate Matter: 5μg/m3
- Repeatability of Particulate Matter: Reproducibility of calibration filter<2%
- Sampling Flow Rate: 4~20L/min (Adjustable)
- Linearity: ±1%F.S.
- Filter Replacement Lifetime: 1~3months
- Analyzing Time: 10~300min (Adjustable)
- Operating Temperature: -30~50°C
- Output: RS232, RS485, Ethernet, GPRS
- Power Supply: 220V AC, 50Hz