AOT CrystalView - Model CPCI -Microscope
The ultimate extension of polarized-light microscopy (PLM), AOT`s CrystalView CPCI ushers in a new era of non-destructive testing of crystallographic structure. CrystalView CPCI allows visualization of material microstructural properties correlated with failure and corrosion probabilities in high-strength and high-performance parts for aerospace, energy, architectural, and medical applications. CrystalView CPCI works in air and, as a parallel imaging technique, at much higher speeds and fields-of-view than scanning alternatives.
CrystalView CPCI is a fast and affordable sensor that allows users to analyze microstructures over larger areas for improved statistics
Measure Non-Destructively
Visualize crystallographic microstructure without cutting your parts
Expand Field-of-View
Collect crystallographic orientation images 1" x 1" and larger
Simplify Sample Preparation
CrystalView is more tolerant of surface imperfections and suffers fewer non-indexed pixels than EBSD
Reduce Cost
Reduce sample preparation and labor costs
Any optical device or sensor that controls or measures polarization will benefit from accurate calibration and comprehensive specifications. These include instruments that characterize nanostructures, fiber composites, textiles, plastics, and semiconductor & optical thin films, microscopes for metallography, crystallography, pharmaceutical chiral analysis, and biomedical tissue assays, telecopes for astronomy, lidar, and laser communication and quantum cryptography. Bring your application and AOT will improve your performance.