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Angstrom - Model AA2000 -Atomic Force Microscope
High Performance: Atomic-scale of resolution. Large sample size. DSP(Digital Signal Processing) for great performance. Real time operating system embedded. Fast Ethernet connection with computer.
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Multi-Function
- Atomic Force Microscope (AFM)
- Lateral Force Microscope (LFM)
- Force Analysis: I-V Curve, I-Z Curve, Force Curve
- Online real-time 3D image for better observation
- Multi-channel signals for more sample details
- Trace-Retrace scan, Back-Forward scan
- Multi-Analysis: Granularity and Roughness
- Data load-out for further analysis
Easy Operation
- Fast automatically tip-engaging
- Easy change of the tip holder, for simple switching between STM and AFM
- Full digital control, auto system status recognition
- Software-based sample movement
- Nano-Movie function: Continuous data collection, storage and replay
- Modularized design for convenient maintenance and future upgrades
