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B&W TekModel BIS1.5 -UV-Vis-NIR Integrating Sphere

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This integrating sphere is machined from PTFE and is the ideal solution for the measurement of diffuse light. It has a diffuse reflectance of 99% between 400nm and 800nm, >98% between 300nm and 1800nm (UV-Vis-NIR region), and >92% between 250nm and 2500nm. Great for characterizing light sources or for use in a radiometric calibrated setup.