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Dakota - Model FX80 -Benchtop Flaw Detector
The Dakota FX80 Benchtop Flaw Detector integrates advanced flaw detection technology with precise material thickness measurement capabilities, proving to be an essential tool for laboratory environments. It includes models FX80-DL and FX81-DL, both featuring time corrected gain (TCG) which compensates for sound attenuation, enhancing overall performance. The FX80 provides a comprehensive grid batching feature allowing the identification of inaccessible locations. It boasts a substantial 6GB internal memory, expandable up to 64GB via an external SD slot, with full data logging through RS232 output to DakMaster™ data management software. Various transducer options including Shear Wave, Single Element, and Transducer Wedges are available for diverse applications. The device adheres to stringent standards with factory calibration traceable to NIST and compliance with EN12668-1 for flaw detection. Its DakMaster™ integration facilitates smooth transition from inspection to detailed reporting, making it a reliable and efficient choice for non-destructive testing applications.
The Dakota FX80 Bench Top Flaw Detector range combines state-of-the-art flaw detection with advanced material thickness capabilities.
Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.
The Dakota FX80 Bench Top Ultrasonic Flaw Detector is available in two models: Dakota FX80-DL Bench Top Flaw Detector and Dakota FX81-DL Bench Top Flaw Detector.
The time corrected gain (TCG) feature automatically compensates for sound attenuation through a material, further increasing the performance of the gauge.
Within the grid batching of the Dakota FX80 Flaw Detector the user has the capability to enter 'OBSTRUCT' on to the grid for easy identification of inaccessible locations to measure.
The Dakota FX80 Ultrasonic Flaw Detector has a 6Gb internal memory and an external SD slot which allows up to 64Gb with full data logging via RS232 data output to DakMaster™ data management software.
- Blanview sunlight readable QVGA TFT colour display
- Sizing Toolkits: DAC, AWS, TCG, DGS
- Pulse Repetition Frequency: 8 to 333 Hz, adjustable
- Screen Refresh Rate: 60Hz
- Detection: Z-Cross, Flank & Peak
- Automatic: probe zero, probe recognition, and temperature compensation
- Measurement: Variety of modes to address a number of applications
- Large data storage: 6Gb internal & up to 64Gb external SD slot
- Multiple formats: Alpha numeric grid and sequential with auto identifier
- Up to 12 hours of battery life
- Download to DakMaster™ data management software