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  • jeol

Jeol Environmental Equipment & Supplies

11 equipment items found

Jeol ElementEye - Model JSX-1000S-ED-XRF - Spectrometer

Jeol ElementEye - Model JSX-1000S-ED-XRF - Spectrometer

Manufactured by:Anadis Instruments Benelux B.V.   based inAlmere, NETHERLANDS
The Jeol ElementEye (JSX-1000S) is a ED-XRF spectrometer, providing easy, quick elemental analysis. The instrument is easy to operate and uses touch panel operation. Swiping the screen makes it possible to switch between displays. Results are displayed real-time. The ElementEye achieves high sensitivity analysis throughout the entire energy range, thanks to the new optical system and the Jeol ...
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Jeol ElementEye - Model S/TEM- JEM-F200 - Multipurpose Analytical Transmission Electron Microscopes (TEM)

Jeol ElementEye - Model S/TEM- JEM-F200 - Multipurpose Analytical Transmission Electron Microscopes (TEM)

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
TheJEM-F200 "F2" Multipurpose Analytical S/TEMis the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical 200kV TEM. The F2 is a multi-purpose workhorse system with advanced features not found ...
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Jeol - Model JIB-4700F - FIB-SEM Multi Beam System

Jeol - Model JIB-4700F - FIB-SEM Multi Beam System

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed theJIB-4700F Multi Beam Systemto be used in morphological observations, elemental and crystallographic analyses of a variety of ...
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Jeol - Model JXA-iSP100 with LaB6 - EPMA-Microprobes

Jeol - Model JXA-iSP100 with LaB6 - EPMA-Microprobes

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
TheJXA-iSP100 with LaB6 EPMAis a state of the art, top of the line, research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM's "SEM Center". It includes new algorithms for the auto functions of both the ...
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Jeol - Model JSM-IT710HR - High Resolution Large Chamber Full-Scale Scanning Electron Microscopes (SEM)

Jeol - Model JSM-IT710HR - High Resolution Large Chamber Full-Scale Scanning Electron Microscopes (SEM)

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
TheJSM-IT710HRField Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and ...
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Jeol - Model JSM-IT510 - Analytical Full-Scale Scanning Electron Microscopes (SEM)

Jeol - Model JSM-IT510 - Analytical Full-Scale Scanning Electron Microscopes (SEM)

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
TheJSM-IT510 InTouchScope SEM Seriesdelivers the highest level of intelligent technology with built-in automation for the most versatile analytical SEM available ...
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Jeol - Model JEM-2100 Plus - Transmission Electron Microscopes (TEM)

Jeol - Model JEM-2100 Plus - Transmission Electron Microscopes (TEM)

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
TheJEM-2100 Plus is a multipurpose 200kV LaB6 TEMthat provides solutions for a wide range of applications from materials science to medical/biological studies, all at a low cost of ...
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Jeol - Model JEM-120i - Transmission Electron Microscopes (TEM)

Jeol - Model JEM-120i - Transmission Electron Microscopes (TEM)

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We developed the JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With the new external appearance, this instrument has evolved into a useful tool that anyone can use easily, from operation to ...
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Jeol - Model JIB-PS500i-FIB-SEM - FIB-SEM System for Sample Analysis

Jeol - Model JIB-PS500i-FIB-SEM - FIB-SEM System for Sample Analysis

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
The all-new JIB-PS500iis a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The flexibility of this new FIB-SEM makes it ideal for both industry and academia. ...
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Jeol - Model JSM-IT210 - Full-Scale Scanning Electron Microscopes (SEM)

Jeol - Model JSM-IT210 - Full-Scale Scanning Electron Microscopes (SEM)

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
TheJSM-IT210 InTouchScope™ SEM Seriesincorporates the latest in JEOL intelligent technology and automation in a compact ...
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Jeol - Model JXA-iHP200F - EPMA-Field Emission Microprobe

Jeol - Model JXA-iHP200F - EPMA-Field Emission Microprobe

Manufactured by:Jeol USA Inc   based inPeabody, MASSACHUSETTS (USA)
The JXA-iHP200F Field Emission EPMA is a state of the art, top of the line, research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM's "SEM Center". It includes new algorithms for the auto functions of ...
CONTACT SUPPLIER
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