Jeol - Model JSM-IT510 -Analytical Full-Scale Scanning Electron Microscopes (SEM)
TheJSM-IT510 InTouchScope SEM Seriesdelivers the highest level of intelligent technology with built-in automation for the most versatile analytical SEM available today.
Smart – Flexible – Powerful
Smart– The latest innovations with our InTouchScope™ series SEMs make them accessible at every level. JEOL’s Intelligent Technology delivers seamless navigation from optical to SEM imaging, Live EDS both spectrum and X-ray maps and the best auto functions from alignment to focus for fast, clear, and sharp images. We’ve taken it to the next level withSimple SEM, built-in automation for image collection at multiple locations and conditions.Simple SEMsimplifies workflow for the most routine tasks. Our embeddedSignal Depthdisplay enhances understanding of analytical spatial resolution. All this technology packed into a compact platform for unprecedented ease-of-use.
Flexible– Choose a platform that is right for you. We offer high vacuum and low vacuum models with or without ourLive(embedded)EDSsystem. [JSM-IT510, JSM-IT510A, JSM-IT510LV, JSM-IT510LA]. This SEM series is equipped with a large specimen chamber that accommodates a wide variety of detectors and accessories such as: EDS, WDS, EBSD, CL, STEM, heating/cooling substages etc.
Powerful – High resolution W filament source (LaB6 option) with unsurpassed low kV performance. The JSM-IT510 includes a large analytical chamber and stage. The stage is mounted inside the chamber enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber.
Zeromag, with our integrated color camera allows for intuitive navigation to the area of interest and seamless transition to SEM imaging and analysis. All data is linked for instant view of analysis locations. Our new high sensitivity quadrant BSE detector can provide aLive 3Dsurface reconstruction enhancing your view of specimens with complex topography such as a fracture surface, plating defect, etc. Analytical models include JEOL’s fully embedded EDS system for Real-Time,Live EDS spectraandLive X-ray maps.
- Specimen Exchange Navi – Integrated step-by-step guide from specimen introduction to automatic image formation. Unprecedented Ease of Use at any level!
- Zeromag – Simplifies navigation providing a seamless transition from an optical to SEM image. All data is linked: color image – SEM images – EDS data for map of all analysis locations.
- Live EDS – Full integration of JEOL EDS with Real-Time Live spectrum and Live X-ray map.
- Simple SEM – simplify workflow and automate routine imaging tasks.
- High Vacuum and Low Vacuum with expanded pressure for any sample type.
- Montage – Automate large area image mosaics (stitching) and EDS maps (analytical models).
- Easy Maintenance – no compressed gas required. Simple source change and Automated Alignments.