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Tescan Environmental Equipment & Supplies
5 equipment items found
Manufactured by:Tescan Group, a.s. based inBrno, CZECH REPUBLIC
A unique combination of plasma FIB and field-free UHR FE-SEM for the widest range of multiscale materials characterization ...
Manufactured by:Baltic Biomaterials Centre of Excellence based inRiga, LATVIA
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simplifies acquisition of both morphological and elemental data from the sample, making VEGA SEM an efficient analytical solution for ...
Manufactured by:Tescan Group, a.s. based inBrno, CZECH REPUBLIC
Secondary electrons (SEs) are low energy electrons emitted from a localised area at the uppermost layers of samples surface (within a range of a few nm depths); therefore, they provide high-resolution imaging suitable for detailed topographical characterisation of samples. SEs are produced when primary electrons from the beam interact inelastically with the specimen. SEs have energies of < 50 ...
Manufactured by:Tescan Group, a.s. based inBrno, CZECH REPUBLIC
Backscattered electrons (BSEs) are high-energy electrons generated as a result of elastic interactions between the primary electron beam and the sample. The range energy of BSEs is from 50 eV up to the energy of the electron beam. BSEs are emitted from a broad region within the interaction volume (the region in the sample where all the beam-sample interactions take place) with a range of ...
Manufactured by:Tescan Group, a.s. based inBrno, CZECH REPUBLIC
The world’s first fully integrated Xe plasma source FIB with SEM enables extremely high ion currents up to 2 μA thus increasing sputtering rate more than 50 times compared to conventional Ga source. This predetermines FERA3 for milling big volumes of materials that were time consuming or impossible so far. This new generation of scanning electron microscopes equipped with focused ion ...