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Laytec Environmental Equipment & Supplies
6 equipment items found
Manufactured by:LayTec AG based inBerlin, GERMANY
The PearL monitoring system analyzes the spectrum of photoluminescent radiation emitted from a probed surface after excitation with laser light. It is designed for in-line integration in production lines. Spectroscopic photoluminescence (sPL) gives access to information on the band gap, electronic defects and the related composition of materials, e.g. the gallium / (gallium+indium) ratio ...
Manufactured by:LayTec AG based inBerlin, GERMANY
EpiTT combines measurements of temperature and reflectance at three wavelengths in one tool. For True Temperature (TT), we apply the method of Emissivity Corrected Pyrometry, which delivers the precise surface temperatures of opaque materials at 950 nm (Si, GaAs, InP). For materials that are transparent at 950 nm (GaN, Sapphire, SiC), EpiTT measures the temperature on the top side of the ...
Manufactured by:LayTec AG based inBerlin, GERMANY
EpiX Mapping stations combine an XY-mapping stage with LayTec spectroscopic reflectance and photoluminescence metrology systems for a comprehensive 2D analysis of optical wafer properties by non-contact measurements. Integrated software provides full automated data analysis, including detection of VCSEL optical parameters (cavity dip, stop-band position), single layer and multiple layer thickness ...
Manufactured by:LayTec AG based inBerlin, GERMANY
ayTec has customized and expanded EpiTT's performance for VCSEL epitaxy: The new EpiTT VCSEL combines spectral reflectance measurements with the robust and industry proven EpiTT performance. EpiTT VCSEL contains two fiber optical heads: one for a standard EpiTT and one for spectral reflectance ...
Manufactured by:LayTec AG based inBerlin, GERMANY
LayTec Flames is a multi-head optical metrology system for monitoring multi-layer thin-film structures in large area processes. It measures multi-traces of layer thickness, reflectance, and transmittance uniformity directly after the deposition in in-line processes with thickness resolutions down to less than 1 ...
Manufactured by:LayTec AG based inBerlin, GERMANY
To overcome the challenges that occur with larger wafers (4', 6' or 8'), you need the advanced EpiCurve® TT system. It combines wafer curvature measurements with all the features of the EpiTT: emissivity-corrected pyrometry and growth rate/thickness measurements by three-wavelength reflectance. This tool will help you avoid cracks, achieve flat wafers and control temperature homogeneity. ...