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BSI - Model αmber-2 -Alpha Spectrometer
Alpha Spectrometer is designed to transform alpha-particle energies into electrical signals, their amplification, filtration, and transformation into spectral lines and their acquisition for spectral analysis with determination of the intensities of spectral lines. Bench top alpha spectrometer α2 contains 2 measurement chambers, which allows for simultaneous analysis of up to two samples. Every Alpha spectrometer chamber includes alpha particle detector, pressure sensor and preamplifier of signals from alpha detector.
The Silicon Ion Implanted Alpha Particle Detector is intended for precise alpha spectroscopy. The thin entrance window of the detectors provides good energy resolution even in close location of the alpha radioactive source and also provides high efficiency registration of alpha particles.
- Two alpha spectrometry chambers with preamplifiers, electronics, valves, etc.
- Two alpha-particle detectors
- Data acquisition and PC interface device
- Built-in spectrometric device
- Vacuum pump
- SpectraLineADA analysis software
- PC with emulation software
- Documentation set
- Execute spectra acquisition for the set time,
- Mark and select regions of interest and examine them on a separate plane,
- Increasing or reducing scale on horizontal and vertical axeis,
- Perform energy calibration of spectra on two known energies;
- Determine centroids and area of peaks with background deduction and without background deduction;
- Make an estimation of energy resolution at one second and one tenth height of full absorption peak;
- Carry out an automatic serial spectra acquisition with automatic record on a disk;
- Print out spectrum window;
- Compare different spectra in one window simultaneously reducing or decreasing scale;
- Calculation of activities of alpha emitting radionuclides.
The detection efficiency calculation and label operations are realized.
The measured spectra and processing results can be saved to database.
This functionality enables to analyze the specified criterions convergence of the repeated measurements.
