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- EddyCus MA dep - Depth Profiler
EddyCus MA dep - Depth Profiler
FromSURAGUS GmbH
The EddyCus MA dep (depth profiler) is worldwide the only eddy current measurement device that utilizes frequencies up to 100 MHz for float sample characterization. High frequencies reduce the penetration depth of the eddy currents which is especially valuable for determination of near surface material characteristics and thin-films. Additionally, the accuracy of thickness characterizations increases with increasing measurement frequency. This is especially valuable for characterization of very low conductive layers. Furthermore, the device supports the generation of depth profiles of many parameters that relate to conductivity and excels with extreme high sensitivity.
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depth profiler
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- Detection of minor conductivity and thickness variation
- High resolution thin-film thickness determination of low and high conductive layers
- Characterization of surface roughness of conductive materials with constant conductivity (RA> 1 μm in material around 30 MS/m)
- Detection of surface defects, delaminations, geometry variations
- Layer thickness determination of thick and thin conductive layers on non conductive or low conductive substrates with very high accuracy, whereas spot size is around 5 - 8 mm
- Generation of near surface depth profiles of material properties
- Layer thickness determination of thick conductive layers ( > 10 μm) on conductive substrates or stack of various layers
- Characterization of material properties such as hardness or microstructure in thin near surface layers of high and low conductive materials
