FST - Model GD90 -High Performance Glow Discharge Mass Spectrometers (GDMS)

• Full elemental analysis of major (wt%) to ultra-trace (ppb to sub-ppb) elements within a single scan
• Direct solid sampling technique alleviating the need for chemical digestion
• Continuously variable high resolution capabilities from 10,000 RP (10% valley definition)
• Dual collectors allowing up to 12 orders of linear dynamic range
• Proven technique for high sensitivity depth-dependent distribution analysis of trace elements in coatings and other multi-layered advanced materials
• Minimal matrix effects allow calibration without matrix matched standards by using Relative Sensitivity Factors (RSF)

• Tantalum cell and source construction for ease of cleaning
• Availability of cryo-cooling of the GD cell to minimise gas backgrounds
• Accommodates both pin and flat cell geometries
• No mass bias for light/heavy elements
• Calibration consists of a quick check of 180Ta and 181Ta to ensure that the IC and Faraday detectors are in agreement
• Low gas flow allows for cost-effective use of an alternate ionisation gas such as krypton
• Ability to analyse a wide range of samples ranging from alloys to high purity materials (both conductive and non-conductive) in a plethora of sample geometries
• Low sputter rate – at normal analytical conditions the sputter rate ranges from 150 nm/minute (conductive) to 100 nm/minute (non-conductive); lowering operational conditions allows sputter rate to be slowed by at least 5x
• RSFs and Detection Limit determinations are derived from published, readily sourced methods
• Front end assembly allows for the fitting of a custom-designed glove box for nuclear applications

GDMS can fully compensate for the shortcomings of ICPMS with solids measurement

• Powders,Oxides,Low m.p. materials
• Pellets,Shards,Foils
• Waste products,Screws,Wires
• Composites,Thin films/coatings,Surface analysis