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IWATSU Electric Co., Ltd.
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IWATSU - Model CS-8000 Series - ...

IWATSU - Model CS-8000 Series -Semiconductor Curve Tracer for Advanced Semiconductor Testing

The CS-8000 Series Semiconductor Curve Tracer by IWATSU is a robust tool for evaluating the design characteristics of wide-gap semiconductors such as Silicon Carbide (SiC) and Gallium Nitride (GaN). Equipped with a Source Measure Unit (SMU) capable of delivering up to 5kV and 2kA, this series supports pulse output, gate pattern, and microcurrent measurement, streamlining the analysis process. The CS-8000 Series, along with other models like the CS-3000, 5000, and 10000, provides automated testing for semiconductors including IGBTs, MOSFETs, transistors, and diodes, catering to both small and large capacity requirements. It integrates seamlessly with the CS-810 parameter measurement software for recording, evidence evaluation, and advanced management of the temperature characteristics of multiple elements. Additional features, such as remote control, Ethernet connectivity, and customizable sweep functions, enhance its usability and ensure precise, automated testing with high PC compatibility.

CS-3000, 5000, 10000Series

Handle leakage current and high current in one unit. Automatic measurements are also possible

Measurement of characteristics of various semiconductors such as IGBTs, MOSFETs, transistors, diodes, etc. from small capacity to large capacity.

By automating the measurement with "Semiconductor Parameter Measurement Software CS-810," it is possible to record as evidence and make judgments.

Make accurate and reliable measurements according to the measurement procedure
Measurement content is also saved as evidence
Auto-judgment is also possible
Control of optional products can also be automated (e.g. temperature control of hot plate)

The wiring status can be checked with graphics“CONFIGURATION”

You can avoid misconnections when measuring your device.

Wave mode where the applied voltage and current can be confirmed by the waveform

You can specify the pulse width and measurement point (timing) while checking the waveform (current, voltage) applied to the device on the time axis like an oscilloscope.
By checking the waveform, you can determine the appropriate pulse width and measurement timing.
There are no waveform changes due to probing as with an oscilloscope, and abnormal signals can be checked.
It is easy to check for thermal abnormalities such as oscillation due to heat generation.

Fully automated with high PC compatibility

With the remote control of the main unit, the software that enables various automatic measurements performs stress tests that were difficult with conventional curve tracers, and simultaneously controls hot plates and thermostatic chambers to fully automate the temperature characteristics of multiple elements.

USB memory device

The image can be TIFF, BMP, or PNG, the background can be black or white, and color/monochrome can be selected. Waveform data can be stored in text and binary at the same time

Remote control tool (free)

When a USB memory device cannot be used for security reasons, the remote control tool installed on the PC provides a solution.

SWEEP

The number of points is variable. It can be set according to the sweep speed and resolution. The sweep direction can be changed depending on the application. In addition, since the custom sweep can sweep only the necessary part, it achieves high-speed high-resolution measurement, especially when automatic measurement is performed.

Vth/hFE automatic search function (option CS-800)

Traditionally, this measurement requires complicated operations, but with this product it can be automatically measured based on the setting conditions.

Limit/Sweep function (option CS-800)

This function applies the limit of normal SWEEP measurement by current and voltage. It can be used to limit current and voltage values applied to the device under measurement for protection, as well as for stopping SWEEP at desired values.