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SPECS Surface Nano Analysis GmbH
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  5. SPECS - Model FE-LEEM P90 - Low Energy ...

SPECS - Model FE-LEEM P90 -Low Energy Electron Microscope

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The SPECS FE-LEEM/PEEM P90 is an advanced Low Energy Electron Microscope designed for high-resolution real-time surface analysis. The instrument provides a resolution of 5 nm, extendable to sub-2 nm with aberration correction, and operates effectively for dynamic LEEM microscopy experiments. Built on Dr. Rudolf Tromp's design, it facilitates nanometer-scale surface process observations with an energy filter for spectromicroscopy. Available in several configurations, including a standard version, aberration-corrected version, and a near ambient pressure (NAP) version for up to 1 mbar pressure studies, the system supports fast specimen exchanges and low vibration measurements. The model can be equipped with a cold field emission electron source and is designed as a turnkey multichamber system, featuring sample storage and comprehensive vacuum equipment. The optional aberration corrector enhances transmission and resolution. The FE-LEEM/PEEM P90 is suitable for operando studies, leveraging near ambient pressure conditions.
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The SPECS LEEM instrument FE-LEEM P90 is a next generation Low Energy Electron Microscope with unsurpassed 5 nm resolution for dynamic LEEM microscopy experiments. With this instrument, based on the design of Dr. Rudolf Tromp, nanometer scale processes on surfaces can be observed in real-time. The instrument is always equipped with an energy filter for spectromicroscopy and is available in a standard version, an aberration corrected version for lateral LEEM resolutions below 2 nm and as a Near Ambient Pressure version for studies in pressures up to 1 mbar.

FE-LEEM/PEEM P90 forms a state-of-the-art surface electron microscope reaching highest resolution in an easy-to-use compact design. Key features are fast specimen exchange, low vibration measurements, and in situ studies on dynamic surface processes. The base system is the PEEM P90 (without electron source) or the FE-LEEM P90 (equipped with a cold field emission electron source). Both are turnkey multichamber systems with an energy filter, sample storage and all necessary vacuum equipment. The system can also be upgraded with an optional aberration corrector for improved transmission and resolution. The FE-LEEM/PEEM is also available in a near ambient pressure version enabling operando studies under pressure conditions of up to 1 mbar.