SPECS Surface Nano Analysis GmbH products

Spectroscopy

SPECS - ProvenX System Series for Surface Analysis

ProvenX System Series, developed by SPECS Surface Nano Analysis GmbH, represents a culmination of advanced techniques for surface analysis. The series includes specific configurations such as ARPES, µ-ARPES, Momentum Microscopy, XPS/UPS, and NAP-XPS, providing solutions for demanding scientific needs. It offers a fixed, compact system design allowing flexible selection of analytical components like hemispherical electron energy analyzers, X-ray sources, UV sources, ion sources, and flood guns. Every component and system configuration within this series has been validated for efficiency and functionality. Given that ProvenX systems bring together the entirety of SPECS' prior systems, they boast pre-determined performance metrics, system schematics, acceptance tests, and installation prerequisites. Ready-to-order with short delivery times, ProvenX systems are tailored for ease of deployment in scientific and industrial applications.

SPECS - FlexMod Modular System for Surface Science Analysis

FlexMod is a series of customizable building-block modules developed by SPECS for surface science analysis. Each module, such as XPS (FlexPS), SPM (FlexPM), Preparation (FlexPrep), and sample introduction (FlexIntro), can be seamlessly integrated or extended in existing systems. The modules have standardized frames and baking tents in terms of shape, size, and height. Optional system automation is available. The systems are designed and manufactured at the SPECS headquarters in Berlin, where a dedicated engineering team oversees the entire process from order to final acceptance. Designed to optimize scientific research, these modules reduce the complexity of system design, allowing scientists to focus on solving scientific problems. The modular concept supports immediate or future combination of different modules to create a multi-method system tailored to current and future needs.

Microscopy

SPECS - Low Energy Electron Microscope

The SPECS FE-LEEM/PEEM P90 is an advanced Low Energy Electron Microscope designed for high-resolution real-time surface analysis. The instrument provides a resolution of 5 nm, extendable to sub-2 nm with aberration correction, and operates effectively for dynamic LEEM microscopy experiments. Built on Dr. Rudolf Tromp's design, it facilitates nanometer-scale surface process observations with an energy filter for spectromicroscopy. Available in several configurations, including a standard version, aberration-corrected version, and a near ambient pressure (NAP) version for up to 1 mbar pressure studies, the system supports fast specimen exchanges and low vibration measurements. The model can be equipped with a cold field emission electron source and is designed as a turnkey multichamber system, featuring sample storage and comprehensive vacuum equipment. The optional aberration corrector enhances transmission and resolution. The FE-LEEM/PEEM P90 is suitable for operando studies, leveraging near ambient pressure conditions.

SPM System for Atomically Resolved STM and AFM

The UHV VT SPM system from SPM Systems provides a robust platform for studying the structure of both conductive and insulating surfaces at an atomic level. Offering a lateral resolution capable of imaging single atoms, the system supports atomically resolved Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) under variable temperature and pressure conditions. The high stability of the Aarhus SPM 150 model facilitates daily usage in diverse experimental environments, including standalone operations or as a modular component in multimethod systems. When integrated with a Nanonis Mimea Control system, the performance of STM and AFM is significantly enhanced. This system is versatile and can be applied in research fields such as surface science, material science, and nanotechnology. It enables comprehensive study of surface phenomena, leveraging its ability to operate in ultrahigh vacuum (UHV), variable temperature (VT), and near-ambient pressure (NAP) conditions, making it suitable for complex material characterization and analysis.

Preparation, Deposition and Integration

SPECS - Specialized Building-Block Modules for Surface Science Analysis

The FlexMod series comprises specialized building-block modules designed for comprehensive surface science analysis. These modules, including FlexPS for photoelectron spectroscopy, FlexPM for scanning probe microscopy, FlexPrep for sample preparation, and FlexIntro for sample introduction, are fully customizable and can be seamlessly integrated with existing systems or combined to form a multifunctional setup. All FlexMod systems are developed and manufactured at SPECS' headquarters in Berlin. Guided by a dedicated engineering group, the entire process from order placement to final acceptance is meticulously overseen to ensure quality and usability. Each module features standardized frames and baking tents, and system automation can be optionally included. This modular approach allows scientists to focus on solving scientific problems rather than dealing with complex system designs, providing the flexibility to expand and adapt the system to new tasks as research requirements evolve.