E+H Metrology GmbH
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E-H-MetrologyModel MX 102-6 -Manual Wafer Measurement Tool

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Up to four thickness measuring range user selectable. Dynamic range 100 or 350µm. Wafer diameter 4", 5" and 6". Accuracy 0.1µm. Resolution 10nm. Spartial resolution 1mm. 4 scans. Software MXNT.

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