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- E-H-Metrology - Model MX 102-6 - Manual ...
E-H-Metrology - Model MX 102-6 -Manual Wafer Measurement Tool
Up to four thickness measuring range user selectable. Dynamic range 100 or 350µm. Wafer diameter 4", 5" and 6". Accuracy 0.1µm. Resolution 10nm. Spartial resolution 1mm. 4 scans. Software MXNT.
