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Model FilmTek 3000 PAR-SE -Combined Ellipsometry and Micro-spot DUV-NIR Reflection/Transmission Spectrophotometry
The FilmTek™ PAR-SE combined metrology line is our most advanced metrology solution, with the highest accuracy, precision, and versatility in the industry. The FilmTek™ 3000 PAR-SE was engineered to meet the needs of any advanced thin film measurement application, and excels at material characterization on both transparent and non-transparent substrates. The FilmTek™ 3000 PAR-SE combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. SCI’s patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
Combining patented Multi-Angle Differential Polarimetry (MADP) and Differential Power Spectral Density (DPSD) technology, the FilmTek™ 3000 PAR-SE utilizes multi-angle polarized spectroscopic reflectometry to independently measure film thickness and index of refraction. By independently measuring index and thickness, the FilmTek™ 3000 PAR-SE is far more sensitive to changes in films, particularly films within multi-layer stacks, than existing metrology tools that rely on conventional ellipsometry or reflectometry techniques.
The FilmTek™ 3000 PAR-SE is a fully-integrated package, paired with advanced material modeling software to make even the most rigorous of measurement tasks reliable and intuitive. Both hardware and software can be easily modified to satisfy unique customer requirements.
- Spectroscopic ellipsometry with rotating compensator design (295nm-1700nm)
- Multi-angle, polarized spectroscopic reflection (190nm-1700nm)
- Spectroscopic transmission measurement (220nm-1000nm)
- Measures film thickness and index of refraction independently
- Multi-Angle Differential Polarimetry (MADP) technology with SCI’s patented Differential Power Spectral Density (DPSD) technology
- Ideal for measuring ultra-thin films (0.03 Å repeatability on native oxide)
- Camera for imaging measurement location
- Pattern recognition
- 50 micron spot size
- Optional generalized ellipsometry (4×4 matrix generalization method) for anisotropy measurements (nx, ny, nz)
- Optional automated sample handling
- Optional SECS/GEM
FilmTek™ 3000 PAR-SE incorporates SCI’s generalized material model with advanced global optimization algorithms for simultaneous determination of:
- Multiple layer thicknesses
- Indices of refraction [ n(λ) ]
- Extinction (absorption) coefficients [ k(λ) ]
- Energy band gap [ Eg ]
- Composition (e.g., %Ge in SiGex; % Ga in GaxIn1-xAs; %Al in AlxGa1-xAs etc.)
- Surface roughness
- Constituent, void fraction
- Crystallinity/Amorphization (e.g., degree of crystallinity of Poly-Si or GeSbTe films)
- Film gradient