The UHV VT SPM system from SPM Systems provides a robust platform for studying the structure of both conductive and insulating surfaces at an atomic level. Offering a lateral resolution capable of imaging single atoms, the system supports atomically resolved Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) under variable temperature and pressure conditions. The high stability of the Aarhus SPM 150 model facilitates daily usage in diverse experimental environments, including standalone operations or as a modular component in multimethod systems. When integrated with a Nanonis Mimea Control system, the performance of STM and AFM is significantly enhanced. This system is versatile and can be applied in research fields such as surface science, material science, and nanotechnology. It enables comprehensive study of surface phenomena, leveraging its ability to operate in ultrahigh vacuum (UHV), variable temperature (VT), and near-ambient pressure (NAP) conditions, making it suitable for complex material characterization and analysis.
