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ModuLab - Model XM MTS -Materials Test System
Widest impedance range - µohms to >100 Tohms. Instant switching between time Domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measurements without changing sample connections. Low frequency to 10 µHz for degradation, trap state and material purity studies. Plug and Play options include – Femto and Sample/Reference modes (for dielectric/insulators). XM-Studio software is included with all XM Series systems. ModuLab XM MTS impedance accuracy contour plot highlights Solartron`s best in class measurement performance.
- I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)
- P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials)
- High-speed pulse (used to activate charge carriers in electronic and dielectric materials)
- Staircase and smooth stepless analog ramp waveforms
- Impedance, admittance, permittivity / capacitance, electrical modulus
- C-V capacitance - voltage, Mott-Schottky
- Automatic sequencing of time domain and impedance/capacitance measurements
ModuLab XM MTS is able to auto-sequence all of the above techniques for charge carrier activation and analysis, without changing sample connections. Temperature control is also built into the software via cryostats, furnaces and probe stations.
The ModuLab XM is a modular system that can be configured for the following applications:
- Dielectric Materials- Ferro/piezoelectrics | MEMs | NEMs| multiferroics | polymers |solid oxides SOFC | ionic conductors | solid electrolytes, quantum dots
- Electronic Materials - LED | LCD | OLED | MEMs | OPV | Si | DSSC | OFET | Ge | GaAs | Perovskite materials
ModuLab XM MTS
The ModuLab XM MTS can perform time domain (DC) and frequency domain (AC) tests. Accessories control temperature from cryostat to furnace level and integrate through software control with the core measurement electroncis to create a sustem to study a wide ranges of mateirals. As with other ModuLab plarogn systems it can be expanded for electrochemical or photoelectrochemical experiments.
The Materials Lab XM users the same XM based platform to deliver ModuLab performance to a focused application, the study of Materials. This focused design allows this instrument to occupy a small footprint. ModuLab software includes integrated equivalent circuit analysis, MultiSine and Harmonic Analysis for non-linear materials.
The 1260A Gain-Phase Analyzer (or Frequency Response Analyzer) is the cornerstone of FRA technology. The 1260A can be used as a stand-alone unit, but its applications to Materials is greatly expanded when combined with the 1296A Dielectric Interface. This solution measures at both high-frequency and high-impedance.
The ModuLab XM MTS can perform time domain (DC) and frequency domain (AC) tests. Accessories control temperature from cryostat to furnace levels and integrate through software control with the core measurement electronics to create a system to study a wide range of materials. As with other ModuLab platform systems it can be expanded for electrochemical or photoelectrochemical experiments.
ModuLab MTS XM’s impedance accuracy contour plot highlights Solartron’s best in class measurement performance.