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NanoSilica - Model 2260 -Particle Size Standards
FromMSP Corporation
NanoSilica Size Standards from MSP Corporation are concentrated aqueous suspensions of SiO2 particles with highly uniform size distributions. These particle size standards, currently available in nominal sizes ranging from 15 to 200nm, are ideally suited for producing high-quality calibration standards for the next generation of wafer inspection tools and systems. Unparalleled quality can be achieved when NanoSilica Size Standards are deposited by MSP's 2300G3 Particle Deposition System onto wafers.Most popular related searches
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- Extremely uniform size distribution.
- Peak diameter measured with NIST traceability.
- Stable when subjected to intense DUV or EUV radiation.
- High particle concentration.
- Easily detect and measure peak diameter with your particle deposition tool, inspection tool, or analytical instrument.
- Avoid discrepancies due to differences between mean and peak diameter values.
- Prepare working suspensions suitable for aerosol generation devices with relatively high or low efficiencies.
- Create long-lasting calibration standards for state-of-the-art inspection tools.
- Consume less material; save money.