SENTECH - Model RM 1000 and RM 2000 -Spectroscopic Reflectometery Tools

SENTECH's RM 1000 and RM 2000 spectroscopic reflectometers are cutting-edge tools specifically designed for refractive index measurements and optical characterization of thin films. These instruments feature a precise single beam reflectance measurement mechanism, optimized through height and tilt adjustments and highly efficient light conduction optics. This ensures accurate and repeatable measurements, even on rough surfaces. The RM 1000 covers a spectral range from 410 nm to 1000 nm, whereas the RM 2000 spans from 200 nm to 1000 nm. Both models can be equipped with an optional x-y mapping stage and mapping software for high-resolution thickness mapping on microscale substrates. They support extensive material analysis capabilities, measuring film thicknesses ranging from 2nm to 100µm, and being versatile enough for applications in industries like microelectronics, optoelectronics, and biotechnologies. SENTECH’s proprietary FTPadv Expert software provides robust data acquisition, modeling, and automatic selection of sample models, making these reflectometers indispensable for advanced research and industrial applications.