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FischerScop - Model XUL Series -X-RAY Fluorescence Measuring (XRF) Instruments
FromHelmut Fischer
Robust Entry-Level X-RAY Fluorescence Measuring (XRF) Instruments for Non-Destructive Material Analysis and Coating Thickness Measurement. Measurement instruments from the XUL series are the solution of choice wherever the need is to determine coating thicknesses quickly and very precisely in electroplating or electronics manufacturing. The X-ray fluorescence instruments measure from bottom to top, enabling easy positioning of samples on the measuring stage. All X-ray instruments in this range are equipped with the same detector. You can choose apertures, filters and X-ray tubes according to the individual measurement task.
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- Simple and fast positioning – even of large samples – for example assembled printed circuit boards or flex PCBs, made possible by the spacious measurement chamber and measurement direction from bottom to top
- Very extensive hardware options, therefore suitable for a variety of measurement tasks
- Optionally equipped with a micro-focus X-ray tube, therefore adaptable for small structures and measurement surfaces of barely 100 µm in diameter
- Measurement of coatings such as Au/Ni/Cu/PCB or Sn/Cu/PCB in the PC Board industry
- Coatings on connectors and contacts in the electronics industry
- Decorative coatings Cr/Ni/Cu/ABS
- Electroplated coatings such as Zn/Fe, ZnNi/Fe as corrosion protection on mass-produced parts (screws and nuts)
- Jewellery and watch industry
- Determination of the metal content of electroplating baths