Forensics and Materials

• “Good” to “bad” sample comparison
• Evaluation of cleaning procedure effectiveness
• Comparison of materials from different lots or vendors

Because chemical bonds absorb infrared energy at specific frequencies (or wavelengths) the basic structure of compounds can be determined by the spectral locations of their IR absorptions because chemical bonds absorb infrared energy at specific frequencies (or wavelengths). The plot of a compound’s IR transmission vs. frequency is its “fingerprint”, which when compared to reference spectra identifies the material. FTIR spectrometers offer speed and sensitivity impossible to achieve with earlier wavelength-dispersive instruments. This capability allows rapid analysis of samples down to the micron level, making the FTIR unmatched as a problem-solving tool in materials analysis.

The FTIR microscope accessory allows spectra from a few nanograms of material to be obtained quickly, with little sample preparation, resulting in more data at lower cost. In some cases, thin films of residue are identified with a sensitivity that rivals or even exceeds electron or ion beam-based surface analysis techniques. There are few sample constraints; solids, liquids and gases can be accommodated. Many contaminants present on reflective surfaces such as solder pads or printed circuitry are readily analyzed in situ using the FTIR microscope in reflectance mode.

With the addition of FTIR to our analytical capabilities, our scientists can now provide you with complete forensic and materials analyses. Join the ranks of our growing list of satisfied customers who choose quality.