Developed by RJ Lee Group, computer-controlled scanning electron microscopy for the identification of gunshot residue (GSR) particles is now widely accepted in the courts. This automated analysis allows us to provide accurate and reliable data along with exceptional turnaround time. Not only are we experts in analyzing GSR, but we are also capable of studying GSR plume distribution using the scanning electron microscope (SEM) to compare sampled GSR to that of the suspected weapon.