Stack Sample Testing

Atlanta-based MVA Scientific Consultants provides customized analyses and scientific support to stack testers and their clients in our 14,000 square foot state-of-the-art facility. We specialize in emission sample particle sizing and in particle and back-half catch material identification. Particle sizing of filter samples (e.g. Method 5) and for sources too clean for gravimetric methods (e.g. Method 202) is accomplished through ISO17025 compliant microscopical methods. Particle and back-half catch identification utilizes a powerful combination of light microscopy, scanning electron microscopy, energy dispersive x-ray spectrometry and micro-Fourier transform infrared spectroscopy.