HP Spectroscopy products

maxLIGHT offers maximum light collection and the highest efficiency in the industry due to its no-slit design. Aberration-corrected flat-field wavelength coverage spans 1nm to 200nm with extensive spectral bandwidths, e. g. 5-80nm per individual grating. The modular design matches a variety of experimental geometries and configurations. maxLIGHT features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

Intuitive and compact spectrograph for the VUV spectral range with competitive pricing. Coverage of 100nm to 300nm using a single grating. Spectrograph and monochromator functionality give highest flexibility.

The highest spectral resolution in convenient flat-field configuration on the market. Resolution of 0.006nm or better combined with wide single-shot wavelength coverage. highLIGHT can be used with or without entrance slit. Its modular design features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

XUV beam characterization made easy: the nanoLIGHT combines the functionalities of an XUV spectrometer and an XUV beam profiler in one unit. Quick integration: the entire device is mounted on a standard CF200 vacuum flange. Switching between operating modes or removal from the XUV beam path is completed within seconds.

The monoLIGHT is a toroidal grating monochromator for laboratory VUV sources, compatible with most models available on the market. In its standard configuration, it is optimized for high efficiency at both He I and He II. Utilizing the full solid angle of the source, it gives extremely high intensity at the sample even after monochromatization. Complete separation of He I α and He I β is achieved while maintaining a narrow bandwidth.

The intuitive, yet versatile X-ray spectrographs for the tender and hard X-ray range feature high-resolution XRF measurements in the 1-12keV energy range.

H+P beamlines are turn-key low-maintenance systems that let you focus on your experiment. High harmonic generation (HHG) from gases or solids provides a table-top source of coherent XUV to soft x-ray radiation. In-line spectrometers serve both as source characterization tools and diagnostics for plasma experiments. As modular platform, H+P beamlines offer a high degree of flexibility for upgrades and extensions. Advanced sub-assemblies such as long-life gas targets or our proprietary XUV / IR delay unit for pump-probe streaking experiments are also available as standalone.

H+P ion spectrometers represent a major improvement over the traditional Thomson parabola. Due to their high energy resolution of >10% combined with angular resolution, they provide high-accuracy estimates for conversion efficiencies from laser into particle energy. In addition, their significantly increased acceptance angle of 30° allows for much more realistic measurements.
Spectral information is provided for each charged ion species. Multiple parameters can be investigated simultaneously, minimizing the impact of shot-to-shot fluctuations.fsssss

The amount of light collected by the spectrometer is the key factor influencing its overall sensitivity and ultimately the most important feature required to obtain high quality data even from weak sources.  Conventional spectrometers use an entrance aperture (slit) at a fixed distance from the grating to create a small source which is then dispersed and imaged onto the detector. In contrast to that the H+P spectrographs can be configured to directly image a radiation source positioned at any distance from the grating onto the detector. In practice this allows for the collection of 15 to 25 times as much light from point-like radiation sources compared to a conventional spectrometer with a 100µm entrance slit without degradation in spectral resolution.