HP Spectroscopy products

maxLIGHT offers maximum light collection and the highest efficiency in the industry due to its no-slit design. Aberration-corrected flat-field wavelength coverage spans 1nm to 200nm with extensive spectral bandwidths, e. g. 5-80nm per individual grating. The modular design matches a variety of experimental geometries and configurations. maxLIGHT features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

Intuitive and compact spectrograph for the VUV spectral range with competitive pricing. Coverage of 100nm to 300nm using a single grating. Spectrograph and monochromator functionality give highest flexibility.

The highest spectral resolution in convenient flat-field configuration on the market. Resolution of 0.006nm or better combined with wide single-shot wavelength coverage. highLIGHT can be used with or without entrance slit. Its modular design features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

XUV beam characterization made easy: the nanoLIGHT combines the functionalities of an XUV spectrometer and an XUV beam profiler in one unit. Quick integration: the entire device is mounted on a standard CF200 vacuum flange. Switching between operating modes or removal from the XUV beam path is completed within seconds.

The monoLIGHT is a toroidal grating monochromator for laboratory VUV sources, compatible with most models available on the market. In its standard configuration, it is optimized for high efficiency at both He I and He II. Utilizing the full solid angle of the source, it gives extremely high intensity at the sample even after monochromatization. Complete separation of He I α and He I β is achieved while maintaining a narrow bandwidth.

The intuitive, yet versatile X-ray spectrographs for the tender and hard X-ray range feature high-resolution XRF measurements in the 1-12keV energy range.

H+P beamlines are turn-key low-maintenance systems that let you focus on your experiment. High harmonic generation (HHG) from gases or solids provides a table-top source of coherent XUV to soft x-ray radiation. In-line spectrometers serve both as source characterization tools and diagnostics for plasma experiments. As modular platform, H+P beamlines offer a high degree of flexibility for upgrades and extensions. Advanced sub-assemblies such as long-life gas targets or our proprietary XUV / IR delay unit for pump-probe streaking experiments are also available as standalone.

H+P ion spectrometers represent a major improvement over the traditional Thomson parabola. Due to their high energy resolution of >10% combined with angular resolution, they provide high-accuracy estimates for conversion efficiencies from laser into particle energy. In addition, their significantly increased acceptance angle of 30° allows for much more realistic measurements.
Spectral information is provided for each charged ion species. Multiple parameters can be investigated simultaneously, minimizing the impact of shot-to-shot fluctuations.fsssss