Jeol USA Inc products

Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We developed the JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With the new external appearance, this instrument has evolved into a useful tool that anyone can use easily, from operation to maintenance.

TheJEM-2100 Plus is a multipurpose 200kV LaB6 TEMthat provides solutions for a wide range of applications from materials science to medical/biological studies, all at a low cost of ownership.

TheJEM-F200 "F2" Multipurpose Analytical S/TEMis the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The `F2` employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical 200kV TEM. The F2 is a multi-purpose workhorse system with advanced features not found in any other non-aberration corrected S/TEM.

TheJSM-IT710HRField Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis.

TheJSM-IT510 InTouchScope  SEM Seriesdelivers the highest level of intelligent technology with built-in automation for the most versatile analytical SEM available today.

TheJSM-IT210 InTouchScope™ SEM Seriesincorporates the latest in JEOL intelligent technology and automation in a compact package.

The JXA-iHP200F Field Emission EPMA is a state of the art, top of the line, research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM`s "SEM Center". It includes new algorithms for the auto functions of both the SEM column and the optical microscope. A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range of user experience from the novice/occasional user to complete flexibility and capabilities for the very experienced EPMA scientist. A full knobset and stage control module are both standard.

TheJXA-iSP100 with LaB6 EPMAis a state of the art, top of the line, research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM`s "SEM Center". It includes new algorithms for the auto functions of both the SEM column and the optical microscope. A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range of user experience from the novice/occasional user to complete flexibility and capabilities for the very experienced EPMA scientist. A full knobset and stage control module are both standard.

The all-new JIB-PS500iis a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The flexibility of this new FIB-SEM makes it ideal for both industry and academia. 

Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed theJIB-4700F Multi Beam Systemto be used in morphological observations, elemental and crystallographic analyses of a variety of specimens.