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Jeol - Model JSM-IT710HR -High Resolution Large Chamber Full-Scale Scanning Electron Microscopes (SEM)
TheJSM-IT710HRField Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis.
Our unique in-lens field emission gun and advanced electron optics deliver large probe currents while maintaining a small probe making this microscope ideally suited for high resolution applications. This highly versatile SEM is compact in design yet is equipped with a large chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state.
Smart – Flexible - Powerful
Smart– Accessible at any level with the latest innovations from JEOL’s intelligent technology. Best-in-class auto functions from alignment to focus delivers clear, high-resolution images in seconds. The workflow is fast withZeromag, using our built-in optical camera for navigation and seamless transition to SEM imaging. ViewLive EDSbothspectrum and X-ray mapswith our analytical models. We’ve taken it to the next level by includingAutomation, fromMontage(large area mosaics) toSimple SEMfor automatic image collection at multiple locations, magnifications, and conditions. All this technology is packed into a compact platform for unprecedented ease-of-use.
Flexible– The JSM-IT710HR is equipped with a large specimen chamber with multiple ports that are optimally positioned for analytical attachments such as: multiple EDS, EBSD (co-planar with EDS), WDS, CL, STEM, heating/cooling sub-stages etc. There is a large, internal, mechanically eucentric stage with the advantage of easy placement of large and heavy specimens and arranging their orientation prior to closing the door and evacuating the chamber.
Powerful– The combination of JEOL’s unique in-lens field emission gun with up to 300nA of beam current and the aperture angle control lens which optimizes large probe currents to the smallest probe diameter delivers high spatial resolution imaging and analytical results. Our high-sensitivity, quadrant BSE detector provides aLive 3Dsurface reconstruction enhancing your view of specimens with complex topography. Analytical models include JEOL’s fully embedded EDS system for Real-Time,Live EDS spectraandLive X-ray maps. Built-inautomationboth streamlines and enhances throughput and internal Data Management software links all data for instant view of analysis locations. This SEM also supports live web viewing and remote control and is open to Python scripting.
- In-lens Schottky field emission gun delivers ≥300nA to the specimen
- Advanced auto functions including beam alignment, focus, astigmatism correction
- Large specimen chamber with multiple ports
- Mechanically eucentric, large, specimen stage mounted in the chamber
- Zeromag – Simplifies navigation providing a seamless transition from an optical to SEM image. All data is linked: color image – SEM images – EDS data for map of all analysis locations.
- Live Analysis – Full integration of JEOL EDS with Real-Time Live spectrum and Live X-ray map
- Automation. Montage – Automate multiple large area image mosaics (stitching) and EDS maps (analytical models). Simple SEM – simplify workflow and automate routine imaging. Recipes for multiple kV, detector, magnifications and more!
- High Vacuum and Low Vacuum models for any sample type. Easy one click transition from High to Low vacuum.
- Specimen Exchange – Integrated step-by-step guide from specimen introduction to automatic image formation. Unprecedented Ease of Use at any level!
- Small footprint and easy maintenance (no cooling water required)
