Jeol - Model JSM-IT210 -Full-Scale Scanning Electron Microscopes (SEM)

Smart– The latest innovations with our InTouchScope™ series SEMs make them accessible at every level. ASpecimen Exchangemode guides a new operator step-by-step from sample introduction to automatic condition setting and image formation. JEOL’s intelligent technology delivers best-in-class auto functions from alignment to focus for fast, clear, high-resolution images. With our built-in optical camera for navigation and seamless transition to SEM imaging the workflow is fast and easy. ViewLive EDSbothspectrum and X-ray mapswith our analytical models. Take it to the next level with built-inautomation, fromMontage(large area mosaics) toSimple SEMfor automatic image collection at multiple locations, magnifications, and conditions. All this technology is packed into a compact platform for unprecedented ease-of-use.

Flexible– Choose a platform that is right for you. We offer high vacuum and low vacuum models with or without our Live (embedded) EDS system. [JSM-IT210, JSM-IT210A, JSM-IT210LV, JSM-IT210LA].

Powerful– High resolution tungsten source with unsurpassed low voltage performance. Enhanced algorithms for automatic beam alignment, auto focus and stigma correction allow you to focus on results. The high precision, 5-axis motorized stage enhances throughput.Zeromagwith its integrated color camera allows for intuitive navigation to the area of interest and seamless transition to SEM imaging and analysis. Our high sensitivity quadrant BSE detector provides aLive 3Dsurface reconstruction enhancing your view of specimens with complex topography. Analytical models include JEOL’s fully embedded EDS system for Real-Time,Live EDS spectraandLive X-ray maps. Internal Data Management links all data for instant view of analysis locations.

• Specimen Exchange – Integrated step-by-step guide from specimen introduction to automatic image formation. Unprecedented Ease of Use at any level!
• Zeromag – Simplifies navigation providing a seamless transition from an optical to SEM image. All data is linked: color image – SEM images – EDS data for map of all analysis locations.
• Live EDS – Full integration of JEOL EDS with Real-Time Live spectrum and Live X-ray map.
• Automation. Montage – Automate multiple large area image mosaics (stitching) and EDS maps (analytical models). Simple SEM – simplify workflow and automate routine imaging. Recipes for multiple kV, detector, magnifications and more!
• Signal Depth – this function enhances understanding of analytical spatial resolution by displaying the generation depth of characteristic X-ray signals.
• High Vacuum and Low Vacuum models for any sample type. Easy one click transition from High to Low vacuum.
• Easy Maintenance – No special facilities or compressed gas required. Plugs into standard laboratory wall outlet. Simple source change and automated alignments.