SPECS Surface Nano Analysis GmbH products

Microscopy

SPECS - Model FE-LEEM P90 - Low Energy Electron Microscope

The SPECS FE-LEEM/PEEM P90 is an advanced Low Energy Electron Microscope designed for high-resolution real-time surface analysis. The instrument provides a resolution of 5 nm, extendable to sub-2 nm with aberration correction, and operates effectively for dynamic LEEM microscopy experiments. Built on Dr. Rudolf Tromp's design, it facilitates nanometer-scale surface process observations with an energy filter for spectromicroscopy. Available in several configurations, including a standard version, aberration-corrected version, and a near ambient pressure (NAP) version for up to 1 mbar pressure studies, the system supports fast specimen exchanges and low vibration measurements. The model can be equipped with a cold field emission electron source and is designed as a turnkey multichamber system, featuring sample storage and comprehensive vacuum equipment. The optional aberration corrector enhances transmission and resolution. The FE-LEEM/PEEM P90 is suitable for operando studies, leveraging near ambient pressure conditions.

Model UHV VT - SPM System for Atomically Resolved STM and AFM

The UHV VT SPM system from SPM Systems provides a robust platform for studying the structure of both conductive and insulating surfaces at an atomic level. Offering a lateral resolution capable of imaging single atoms, the system supports atomically resolved Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) under variable temperature and pressure conditions. The high stability of the Aarhus SPM 150 model facilitates daily usage in diverse experimental environments, including standalone operations or as a modular component in multimethod systems. When integrated with a Nanonis Mimea Control system, the performance of STM and AFM is significantly enhanced. This system is versatile and can be applied in research fields such as surface science, material science, and nanotechnology. It enables comprehensive study of surface phenomena, leveraging its ability to operate in ultrahigh vacuum (UHV), variable temperature (VT), and near-ambient pressure (NAP) conditions, making it suitable for complex material characterization and analysis.