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35 equipment items found
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Manufactured by:VIEW Micro Metrology based inRochester, NEW YORK (USA)
VIEW Precis combines the XYZ accuracy of VIEW systems with ultra-high magnification optics. Precis features a microscope objective turret and a high performance Z-axis motion assembly to provide the best possible optical focus at extreme magnifications. The most accurate XY stage VIEW has to offer combined with the versatile yet powerful objective turret creates a metrology machine for the most ...
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Manufactured by:VIEW Micro Metrology based inRochester, NEW YORK (USA)
The VIEW Benchmark 450 delivers high performance with generous measuring envelopes. The system’s stage handles large form-factor parts with high precision in a rugged, shop-floor configuration with a small footprint. Its fixed bridge design separates the X and Y axis motions, allowing each to operate without any influence on the other. This arrangement provides the maximum mechanical ...
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Manufactured by:VIEW Micro Metrology based inRochester, NEW YORK (USA)
The VIEW Summit systems are designed for components requiring a large work envelope and high accuracy. Based on the same core technologies of optics, high speed linear motors, and high resolution scales used in the VIEW Pinnacle, the Summit features a fixed bridge design. Separate X and Y axis motion systems ensure that neither influences the mechanical integrity of the other, while also enabling ...
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Manufactured by:VIEW Micro Metrology based inRochester, NEW YORK (USA)
VIEW Summit systems are designed for components requiring a large work envelope and high accuracy. Based on core technologies of high-end optics, high-speed linear motors, and high-resolution scales, the Summit 600 features a fixed bridge design. Separate X and Y axis motion systems ensure that neither influences the mechanical integrity of the other, while also enabling easy loading and ...
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Manufactured by:VIEW Micro Metrology based inRochester, NEW YORK (USA)
The VIEW Benchmark 250 is engineered for high accuracy in a compact benchtop configuration complete with VIEW's dual magnification optics and metrology-grade construction. The Benchmark 250 is designed for use on the production floor to provide precision measurements for process control. Its compact size and powerful software make the Benchmark 250 a versatile measurement system that can be ...
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Manufactured by:VIEW Micro Metrology based inRochester, NEW YORK (USA)
The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW line. Its high performance and compact footprint make it VIEW’s most popular model. The Pinnacle features a damped granite base and column, with passive vibration isolation. A precision compound X-Y stage with high-speed linear motor drives provides velocity of 400 mm / sec and acceleration of 1000 mm / sec2. This ...
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Manufactured by:VIEW Micro Metrology based inRochester, NEW YORK (USA)
Pinnacle Plus elevates Pinnacle performance to the next level. Pinnacle+ Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/ State-of-the-art linear motion control technology provides the fastest, most reliable platform available for high capacity operation in ...
Manufactured by:E+H Metrology GmbH based inKarlsruhe, GERMANY
Up to four thickness measuring range user selectable. Dynamic range 100 or 350µm. Wafer diameter 4", 5" and 6". Accuracy 0.1µm. Resolution 10nm. Spartial resolution 1mm. 4 scans. Software ...
Manufactured by:E+H Metrology GmbH based inKarlsruhe, GERMANY
The MX base series are manual tools, where some of them can also be used as modules on E+H automatic robot tools or as OEM tools.Please note that all technical tool specifications can be modified to your wishes in accordance with the physical limits of the tool.High Resolution Wafer Tool Up to four thickness measuring range user selectable. Dynamic range 100 or 350µm. Wafer diameter 6' and ...
Manufactured by:E+H Metrology GmbH based inKarlsruhe, GERMANY
The MX base series are manual tools, where some of them can also be used as modules on E+H automatic robot tools or as OEM tools.Please note that all technical tool specifications can be modified to your wishes in accordance with the physical limits of the tool. High Resolution Wafer Tool Up to four thickness measuring range user selectable. Dynamic range 100 or 350µm.Wafer diameter 8' and ...
Manufactured by:E+H Metrology GmbH based inKarlsruhe, GERMANY
We customize your MX 202 perfectly fitting to your demands (e.g. metrology, sender/receiver stations).Speed, Speed and Speed. Sort with up to 1000 Wafers per ...
Manufactured by:E+H Metrology GmbH based inKarlsruhe, GERMANY
The quality of a capacitive sensor system can be rated by the sensors range, accuracy and precision in relation to the required size of the active sensor surface. The E+H capative technology is now developed for more than 40 years.E+Hs seamless construction of the entire sensor system, starting at the sensor, own special cables (constructed by E+H) and the sophisticated electronic lead to a ...
Manufactured by:Vacuum Metrology Inc. based inBoston, MASSACHUSETTS (USA)
Vacuum Metrology now offers to retrofit your manual PVS6E system into a state of the art automatic calibration system with all the capabilities of our flagship AVCS product. Give new life to an old system by drastically increasing productivity, repeatability and reliability. And save a lot of money in the ...
Manufactured by:Fine Metrology S.r.l. based inSpadafora (ME), ITALY
Type “EL” certified with accuracy of 5% available with special certification ±2% Range of permeation rate ±25% Dimensions in mm : diameter max 9; length max 84 + length of permeable tube proportional to desired permeation ...
Manufactured by:Fine Metrology S.r.l. based inSpadafora (ME), ITALY
Type “BTEX” certified with accuracy of 5% available with special certification ±2% Range of permeation rate ±25% Dimensions in mm : diameter 16,4; length: ...
Manufactured by:Innovalia Metrology based inAltube-Zuia, SPAIN
We provide solutions for different needs within the metrological software field. If you need to scan and capture point clouds your actual pieces, M3 Captureis the software you need. And if you go to manage massive point clouds and digital parts, M3 Server gives you the best solution on the market. A breakthrough in the whole process of scanning and point cloud management is able to work in a ...
Manufactured by:Innovalia Metrology based inAltube-Zuia, SPAIN
Innovalia Metrology’s OptiScan is a high-speed 3D scanning sensor with a range of features that make it ideal for use in the manufacturing industry. It is known for its fast scanning speed, high resolution and accuracy, and the ability to easily scan a variety of surfaces including shiny and reflective ones. Additionally, OptiScan has automatic exposure settings and is compatible with all ...
Manufactured by:Vacuum Metrology Inc. based inBoston, MASSACHUSETTS (USA)
The VMS2Ph is a high-accuracy calibration system tailored for the pharmaceutical industry, specifically for the calibration of lyophilization gauges. Developed by Vacuum Metrology Systems, this portable unit is compliant with CFR Title 21, Part 11, offering automatic, semi-automatic, and manual modes. It comprises a robust Calibration Management Software that ensures the system meets ISO 9001, ...
Manufactured by:Vacuum Metrology Inc. based inBoston, MASSACHUSETTS (USA)
The AVCS3SD is an advanced stationary automatic calibration system designed for precise verification and calibration of various vacuum gauges across a wide pressure range from 1.3x10-3 to 1.3x10+5 Pa (1x10-5 to 1000 Torr). It accommodates multiple gauge types, including Capacitance Manometers, Pirani, Piezo, Cold and Hot Cathode gauges, in compliance with ISO 3567:2011(E) standards. The system ...
Manufactured by:E+H Metrology GmbH based inKarlsruhe, GERMANY
The MX base series are manual tools, where some of them can also be used as modules on E+H automatic robot tools or as OEM tools.Please note that all technical tool specifications can be modified to your wishes in accordance with the physical limits of the tool. High Resolution Wafer Tools Up to four thickness measuring range user selectable. . Dynamic range 100 or 350µm. Wafer diameter 300 ...