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microPREP™Model 1.1 -High-Throughput Laser Based Microdiagnostics Sample Preparation

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The all-new microPREP™ is the first instrument to enable fast, clean, and efficient laser ablation available for the preparation of samples for microstructure diagnostics and failure analysis. microPREP™ provides key benefits of micromachining using ultrashort pulsed lasers, particularly low structural damage, high power densities and targeted precision on the micron scale. microPREP™ 1.1  is suited for TEM, X-SEM, and micromechanical testing in semiconductors, metals, ceramics, as well as compounds.

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  • Shorter time to sample: up to 10 000 times faster than FIB
  • Analysis-adopted sample geometry
  • Minimized risk of sample loss
  • Recipe-driven GUI for sample geometries and materials
  • Reduced FIB capacity requirements
  • Enhanced efficiency of existing (TEM) analysis tools
  • Custom recipes and fixtures on request
  • Meets the essential requirements of the SEMI S2/S8