WITec TrueSurface - Topographic Raman Microscopy Imaging

3D chemical characterization on rough, inclined or irregularly-shaped samples can be carried out precisely along or at a set distance from a surface without requiring sample preparation.

 In confocal microscopy, light from outside the focal plane is strongly reduced by the detection pinhole. With the TrueSurface module the sample`s surface can be kept in focus during the entire measurement procedure, irrespective of its topography.

The optical sensor controls the distance between the objective and the sample surface with sub-micrometer precision. Thus, any variation occurring during measurements with long integration times is compensated for, resulting in perfectly sharp and detailed images.