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Advantest SoC - Model V93000 -Wave Scale Test System
Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test the current and upcoming generations of communication devices. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. ADVANTEST’s Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices.
Paving the Way for Testing 5G ICs
Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both today’s and emerging LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. The cards’ advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test.
Optimal Testing for RF Devices
The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. Along with the card’s 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices.
Test Solution for Mixed-Signal ICs
The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. The card’s 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency.
Extends Highly Parallel Testing Capabilities
With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industry’s highest parallelism and the most reliable AC and DC performance. The card’s innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card.